Multi-Modal Generative Models for Learning Epistemic Active Sensing

Korthals T, Rudolph D, Hesse M, Rückert U (Accepted)
In: 2019 IEEE International Conference on Robotics and Automation. Piscataway, NJ: IEEE.

Konferenzbeitrag | Angenommen | Englisch
 
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Stichworte
publication
Erscheinungsjahr
2019
Titel des Konferenzbandes
2019 IEEE International Conference on Robotics and Automation
Konferenz
2019 IEEE International Conference on Robotics and Automation
Konferenzort
Montreal, Canada
Konferenzdatum
2019-05-20 – 2019-05-24
Page URI
https://pub.uni-bielefeld.de/record/2934957

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Korthals T, Rudolph D, Hesse M, Rückert U. Multi-Modal Generative Models for Learning Epistemic Active Sensing. In: 2019 IEEE International Conference on Robotics and Automation. Piscataway, NJ: IEEE; Accepted.
Korthals, T., Rudolph, D., Hesse, M., & Rückert, U. (Accepted). Multi-Modal Generative Models for Learning Epistemic Active Sensing. 2019 IEEE International Conference on Robotics and Automation Piscataway, NJ: IEEE.
Korthals, T., Rudolph, D., Hesse, M., and Rückert, U. (Accepted). “Multi-Modal Generative Models for Learning Epistemic Active Sensing” in 2019 IEEE International Conference on Robotics and Automation (Piscataway, NJ: IEEE).
Korthals, T., et al., Accepted. Multi-Modal Generative Models for Learning Epistemic Active Sensing. In 2019 IEEE International Conference on Robotics and Automation. Piscataway, NJ: IEEE.
T. Korthals, et al., “Multi-Modal Generative Models for Learning Epistemic Active Sensing”, 2019 IEEE International Conference on Robotics and Automation, Piscataway, NJ: IEEE, Accepted.
Korthals, T., Rudolph, D., Hesse, M., Rückert, U.: Multi-Modal Generative Models for Learning Epistemic Active Sensing. 2019 IEEE International Conference on Robotics and Automation. IEEE, Piscataway, NJ (Accepted).
Korthals, Timo, Rudolph, Daniel, Hesse, Marc, and Rückert, Ulrich. “Multi-Modal Generative Models for Learning Epistemic Active Sensing”. 2019 IEEE International Conference on Robotics and Automation. Piscataway, NJ: IEEE, Accepted.

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