VEDLIoT: Very Efficient Deep Learning in IoT

Kaiser M, Griessl R, Kucza N, Haumann C, Tigges L, Mika K, Hagemeyer J, Porrmann F, Rückert U, vor dem Berge M, Krupop S, et al. (2022)
In: DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe. Institut of Electrical and Electronics Engineers (IEEE) (Ed); Leuven: European Design and Automation Association: 963-968.

Konferenzbeitrag | Veröffentlicht | Englisch
 
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herausgebende Körperschaft
Institut of Electrical and Electronics Engineers (IEEE)
Erscheinungsjahr
2022
Titel des Konferenzbandes
DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe
Seite(n)
963-968
Konferenz
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Konferenzort
Antwerp, Belgium
Konferenzdatum
2022-03-14 – 2022-03-23
eISBN
978-3-9819263-6-1
Page URI
https://pub.uni-bielefeld.de/record/2964196

Zitieren

Kaiser M, Griessl R, Kucza N, et al. VEDLIoT: Very Efficient Deep Learning in IoT. In: Institut of Electrical and Electronics Engineers (IEEE), ed. DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe. Leuven: European Design and Automation Association; 2022: 963-968.
Kaiser, M., Griessl, R., Kucza, N., Haumann, C., Tigges, L., Mika, K., Hagemeyer, J., et al. (2022). VEDLIoT: Very Efficient Deep Learning in IoT. In Institut of Electrical and Electronics Engineers (IEEE) (Ed.), DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe (pp. 963-968). Leuven: European Design and Automation Association. https://doi.org/10.23919/DATE54114.2022.9774653
Kaiser, M., Griessl, R., Kucza, N., Haumann, C., Tigges, L., Mika, K., Hagemeyer, J., Porrmann, F., Rückert, U., vor dem Berge, M., et al. (2022). “VEDLIoT: Very Efficient Deep Learning in IoT” in DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe, Institut of Electrical and Electronics Engineers (IEEE) ed. (Leuven: European Design and Automation Association), 963-968.
Kaiser, M., et al., 2022. VEDLIoT: Very Efficient Deep Learning in IoT. In Institut of Electrical and Electronics Engineers (IEEE), ed. DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe. Leuven: European Design and Automation Association, pp. 963-968.
M. Kaiser, et al., “VEDLIoT: Very Efficient Deep Learning in IoT”, DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe, Institut of Electrical and Electronics Engineers (IEEE), ed., Leuven: European Design and Automation Association, 2022, pp.963-968.
Kaiser, M., Griessl, R., Kucza, N., Haumann, C., Tigges, L., Mika, K., Hagemeyer, J., Porrmann, F., Rückert, U., vor dem Berge, M., Krupop, S., Porrmann, M., Tassemeier, M., Trancoso, P., Qararyah, F., Zouzoula, S., Casimiro, A., Bessani, A., Cecilio, J., Andersson, S., Brunnegard, O., Eriksson, O., Weiss, R., Mcierhofer, F., Salomonsson, H., Malekzadeh, E., Odman, D., Khurshid, A., Felber, P., Pasin, M., Schiavoni, V., Menetrey, J., Gugala, K., Zierhoffer, P., Knauss, E., Heyn, H.: VEDLIoT: Very Efficient Deep Learning in IoT. In: Institut of Electrical and Electronics Engineers (IEEE) (ed.) DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe. p. 963-968. European Design and Automation Association, Leuven (2022).
Kaiser, Martin, Griessl, René, Kucza, Nils, Haumann, Carola, Tigges, Lennart, Mika, Kevin, Hagemeyer, Jens, Porrmann, Florian, Rückert, Ulrich, vor dem Berge, M., Krupop, S., Porrmann, M., Tassemeier, M., Trancoso, P., Qararyah, F., Zouzoula, S., Casimiro, A., Bessani, A., Cecilio, J., Andersson, S., Brunnegard, O., Eriksson, O., Weiss, R., Mcierhofer, F., Salomonsson, H., Malekzadeh, E., Odman, D., Khurshid, A., Felber, P., Pasin, M., Schiavoni, V., Menetrey, J., Gugala, K., Zierhoffer, P., Knauss, E., and Heyn, H. “VEDLIoT: Very Efficient Deep Learning in IoT”. DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe. Ed. Institut of Electrical and Electronics Engineers (IEEE). Leuven: European Design and Automation Association, 2022. 963-968.

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