Evaluation of heterogeneous AIoT Accelerators within VEDLIoT

Griessl R, Porrmann F, Kucza N, Mika K, Hagemeyer J, Kaiser M, Porrmann M, Tassemeier M, Flottmann M, Qararyah F, Waqar M, et al. (2023)
In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE: 1-6.

Konferenzbeitrag | Veröffentlicht | Englisch
 
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Autor*in
Griessl, RenéUniBi; Porrmann, FlorianUniBi; Kucza, NilsUniBi; Mika, KevinUniBi; Hagemeyer, JensUniBi; Kaiser, MartinUniBi ; Porrmann, M.; Tassemeier, M.; Flottmann, M.; Qararyah, F.; Waqar, M.; Trancoso, P.
Alle
Abstract / Bemerkung
Within VEDLIoT, a project targeting the development of energy-efficient Deep Learning for distributed AIoT applications, several accelerator platforms based on technologies like CPUs, embedded GPUs, FPGAs, or specialized ASICs are evaluated. The VEDLIoT approach is based on modular and scalable cognitive IoT hardware platforms. Modular microserver technology enables the integration of different, heterogeneous accelerators into one platform. Benchmarking of the different accelerators takes into account performance, energy efficiency and accuracy. The results in this paper provide a solid overview regarding available accelerator solutions and provide guidance for hardware selection for AIoT applications from far edge to cloud. VEDLIoT is an H2020 EU project which started in November 2020. It is currently in an intermediate stage. The focus is on the considerations of the performance and energy efficiency of hardware accelerators. Apart from the hardware and accelerator focus presented in this paper, the project also covers toolchain, security and safety aspects. The resulting technology is tested on a wide range of AIoT applications.
Erscheinungsjahr
2023
Titel des Konferenzbandes
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Seite(n)
1-6
Konferenz
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Konferenzort
Antwerp, Belgium
Page URI
https://pub.uni-bielefeld.de/record/2979799

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Griessl R, Porrmann F, Kucza N, et al. Evaluation of heterogeneous AIoT Accelerators within VEDLIoT. In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE; 2023: 1-6.
Griessl, R., Porrmann, F., Kucza, N., Mika, K., Hagemeyer, J., Kaiser, M., Porrmann, M., et al. (2023). Evaluation of heterogeneous AIoT Accelerators within VEDLIoT. 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6. IEEE. https://doi.org/10.23919/DATE56975.2023.10137021
Griessl, René, Porrmann, Florian, Kucza, Nils, Mika, Kevin, Hagemeyer, Jens, Kaiser, Martin, Porrmann, M., et al. 2023. “Evaluation of heterogeneous AIoT Accelerators within VEDLIoT”. In 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6. IEEE.
Griessl, R., Porrmann, F., Kucza, N., Mika, K., Hagemeyer, J., Kaiser, M., Porrmann, M., Tassemeier, M., Flottmann, M., Qararyah, F., et al. (2023). “Evaluation of heterogeneous AIoT Accelerators within VEDLIoT” in 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) (IEEE), 1-6.
Griessl, R., et al., 2023. Evaluation of heterogeneous AIoT Accelerators within VEDLIoT. In 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, pp. 1-6.
R. Griessl, et al., “Evaluation of heterogeneous AIoT Accelerators within VEDLIoT”, 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), IEEE, 2023, pp.1-6.
Griessl, R., Porrmann, F., Kucza, N., Mika, K., Hagemeyer, J., Kaiser, M., Porrmann, M., Tassemeier, M., Flottmann, M., Qararyah, F., Waqar, M., Trancoso, P., Ödman, D., Gugala, K., Latosinski, G.: Evaluation of heterogeneous AIoT Accelerators within VEDLIoT. 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). p. 1-6. IEEE (2023).
Griessl, René, Porrmann, Florian, Kucza, Nils, Mika, Kevin, Hagemeyer, Jens, Kaiser, Martin, Porrmann, M., Tassemeier, M., Flottmann, M., Qararyah, F., Waqar, M., Trancoso, P., Ödman, D., Gugala, K., and Latosinski, G. “Evaluation of heterogeneous AIoT Accelerators within VEDLIoT”. 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE). IEEE, 2023. 1-6.
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