SSB: A new diversity selection combining scheme and its test-bed implementation

Xu F, Rückert U (2007)
In: Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on. Institute of Electrical and Electronics Engineers (Ed); Piscataway, NJ: IEEE: 561-566.

Konferenzbeitrag | Veröffentlicht | Englisch
 
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Autor*in
herausgebende Körperschaft
Institute of Electrical and Electronics Engineers
Abstract / Bemerkung
SSB (Simplified Switched Beam) was originallymotivated by a simple beamforming technique. It is expected toincrease the performance of Mobile Ad Hoc Networks (MANETs)by associating with the dedicated MAC protocol [12]. However,we further find that it is a variation of the antenna diversityscheme, which is called GSC in [6] and H-S/MRC in [11]. SSBonly requires one RF front-end and a simple additional processingunit, hence it has apparent advantage in terms of size, power,expense and complexity. Its 2.4 GHz test-bed for reception hasbeen implemented recently. Intensive measurements show thatSSB can help to suppress the effect of fading, enhance the SNRand finally result in the reduced BER.
Stichworte
MAC protocol; access protocols; antenna arrays; mobile radio; diversity reception; simple beamforming technique; simplified switched beam; ad hoc networks; fading channel suppression; mobile ad hoc network; multiantenna diversity selection combining scheme; fading channels; bit error rate
Erscheinungsjahr
2007
Titel des Konferenzbandes
Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on
Seite(n)
561 -566
ISBN
9781424410934
Page URI
https://pub.uni-bielefeld.de/record/2286265

Zitieren

Xu F, Rückert U. SSB: A new diversity selection combining scheme and its test-bed implementation. In: Institute of Electrical and Electronics Engineers, ed. Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on. Piscataway, NJ: IEEE; 2007: 561-566.
Xu, F., & Rückert, U. (2007). SSB: A new diversity selection combining scheme and its test-bed implementation. In Institute of Electrical and Electronics Engineers (Ed.), Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on (pp. 561-566). Piscataway, NJ: IEEE. doi:10.1109/ICTMICC.2007.4448703
Xu, F., and Rückert, U. (2007). “SSB: A new diversity selection combining scheme and its test-bed implementation” in Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on, Institute of Electrical and Electronics Engineers ed. (Piscataway, NJ: IEEE), 561-566.
Xu, F., & Rückert, U., 2007. SSB: A new diversity selection combining scheme and its test-bed implementation. In Institute of Electrical and Electronics Engineers, ed. Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on. Piscataway, NJ: IEEE, pp. 561-566.
F. Xu and U. Rückert, “SSB: A new diversity selection combining scheme and its test-bed implementation”, Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on, Institute of Electrical and Electronics Engineers, ed., Piscataway, NJ: IEEE, 2007, pp.561-566.
Xu, F., Rückert, U.: SSB: A new diversity selection combining scheme and its test-bed implementation. In: Institute of Electrical and Electronics Engineers (ed.) Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on. p. 561-566. IEEE, Piscataway, NJ (2007).
Xu, Feng, and Rückert, Ulrich. “SSB: A new diversity selection combining scheme and its test-bed implementation”. Telecommunications and Malaysia International Conference on Communications, 2007. ICT-MICC 2007. IEEE International Conference on. Ed. Institute of Electrical and Electronics Engineers. Piscataway, NJ: IEEE, 2007. 561-566.

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