Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result

Surmann H, Kiziloglu B, Rückert U, Goser K (1991)
In: Proceedings of Neuro-Nimes: Neural Networks and their Applications. 581-591.

Konferenzbeitrag | Veröffentlicht | Englisch
 
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Surmann, Hartmut; Kiziloglu, B.; Rückert, UlrichUniBi; Goser, Karl
Erscheinungsjahr
1991
Titel des Konferenzbandes
Proceedings of Neuro-Nimes: Neural Networks and their Applications
Seite(n)
581-591
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https://pub.uni-bielefeld.de/record/2285327

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Surmann H, Kiziloglu B, Rückert U, Goser K. Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result. In: Proceedings of Neuro-Nimes: Neural Networks and their Applications. 1991: 581-591.
Surmann, H., Kiziloglu, B., Rückert, U., & Goser, K. (1991). Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result. Proceedings of Neuro-Nimes: Neural Networks and their Applications, 581-591.
Surmann, H., Kiziloglu, B., Rückert, U., and Goser, K. (1991). “Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result” in Proceedings of Neuro-Nimes: Neural Networks and their Applications 581-591.
Surmann, H., et al., 1991. Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result. In Proceedings of Neuro-Nimes: Neural Networks and their Applications. pp. 581-591.
H. Surmann, et al., “Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result”, Proceedings of Neuro-Nimes: Neural Networks and their Applications, 1991, pp.581-591.
Surmann, H., Kiziloglu, B., Rückert, U., Goser, K.: Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result. Proceedings of Neuro-Nimes: Neural Networks and their Applications. p. 581-591. (1991).
Surmann, Hartmut, Kiziloglu, B., Rückert, Ulrich, and Goser, Karl. “Neural Networks for Defect Recognition on Masks and Integrated Circuits: First Result”. Proceedings of Neuro-Nimes: Neural Networks and their Applications. 1991. 581-591.
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