Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study

Wrede S, Ponweiser W, Bauckhage C, Sagerer G, Vincze M (2004)
In: Proc. Int. Conf. on Pattern Recognition. British Machine Vision Association, International Association for Pattern Recognition (Eds); (1). Los Alamitos, Calif. : IEEE: 761-764.

Konferenzbeitrag | Veröffentlicht | Englisch
 
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Autor*in
herausgebende Körperschaft
British Machine Vision Association; International Association for Pattern Recognition
Abstract / Bemerkung
Owing to the ever growing complexity of present day computer vision systems, system architecture has become an emerging topic in vision research. Systems that integrate numerous modules and algorithms of different I/O and time scale behavior require sound and reliable concepts for interprocess communication. Consequently, topics and methods known from software and systems engineering are becoming increasingly important. Especially framework technologies for system integration are required. This contribution results from a cooperation between two multinational projects on cognitive vision. It discusses functional and non-functional requirements in cognitive vision and compares and assesses existing solutions.
Erscheinungsjahr
2004
Titel des Konferenzbandes
Proc. Int. Conf. on Pattern Recognition
Ausgabe
1
Seite(n)
761-764
ISBN
0769521282
Page URI
https://pub.uni-bielefeld.de/record/2145328

Zitieren

Wrede S, Ponweiser W, Bauckhage C, Sagerer G, Vincze M. Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study. In: British Machine Vision Association, International Association for Pattern Recognition, eds. Proc. Int. Conf. on Pattern Recognition. Los Alamitos, Calif. : IEEE; 2004: 761-764.
Wrede, S., Ponweiser, W., Bauckhage, C., Sagerer, G., & Vincze, M. (2004). Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study. In British Machine Vision Association & International Association for Pattern Recognition (Eds.), Proc. Int. Conf. on Pattern Recognition (pp. 761-764). Los Alamitos, Calif. : IEEE. https://doi.org/10.1109/icpr.2004.1334307
Wrede, Sebastian, Ponweiser, Wolfgang, Bauckhage, Christian, Sagerer, Gerhard, and Vincze, Markus. 2004. “Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study”. In Proc. Int. Conf. on Pattern Recognition, ed. British Machine Vision Association and International Association for Pattern Recognition, 761-764. Los Alamitos, Calif. : IEEE.
Wrede, S., Ponweiser, W., Bauckhage, C., Sagerer, G., and Vincze, M. (2004). “Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study” in Proc. Int. Conf. on Pattern Recognition, British Machine Vision Association, and International Association for Pattern Recognition eds. (Los Alamitos, Calif. : IEEE), 761-764.
Wrede, S., et al., 2004. Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study. In British Machine Vision Association & International Association for Pattern Recognition, eds. Proc. Int. Conf. on Pattern Recognition. Los Alamitos, Calif. : IEEE, pp. 761-764.
S. Wrede, et al., “Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study”, Proc. Int. Conf. on Pattern Recognition, British Machine Vision Association and International Association for Pattern Recognition, eds., Los Alamitos, Calif. : IEEE, 2004, pp.761-764.
Wrede, S., Ponweiser, W., Bauckhage, C., Sagerer, G., Vincze, M.: Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study. In: British Machine Vision Association and International Association for Pattern Recognition (eds.) Proc. Int. Conf. on Pattern Recognition. p. 761-764. IEEE, Los Alamitos, Calif. (2004).
Wrede, Sebastian, Ponweiser, Wolfgang, Bauckhage, Christian, Sagerer, Gerhard, and Vincze, Markus. “Integration Frameworks for Large Scale Cognitive Vision Systems - An Evaluative Study”. Proc. Int. Conf. on Pattern Recognition. Ed. British Machine Vision Association and International Association for Pattern Recognition. Los Alamitos, Calif. : IEEE, 2004. 761-764.
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