Valid interpretation of feature relevance for linear data mappings
Frenay B, Hofmann D, Schulz A, Biehl M, Hammer B (2014)
In: 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE): 149-156.
Konferenzbeitrag
| Veröffentlicht | Englisch
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fs_bounds_preprint.pdf
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Autor*in
Frenay, Benoit;
Hofmann, DanielaUniBi;
Schulz, AlexanderUniBi 
;
Biehl, Michael;
Hammer, BarbaraUniBi
;
Biehl, Michael;
Hammer, BarbaraUniBi Einrichtung
Erscheinungsjahr
2014
Titel des Konferenzbandes
2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM)
Seite(n)
149 - 156
Urheberrecht / Lizenzen
Konferenz
IEEE Symposium on Computational Intelligence and Data Mining (CIDM)
Konferenzdatum
2014-12-09 – 2014-2-12
ISBN
978-1-4799-4518-4
Page URI
https://pub.uni-bielefeld.de/record/2900320
Zitieren
Frenay B, Hofmann D, Schulz A, Biehl M, Hammer B. Valid interpretation of feature relevance for linear data mappings. In: 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE); 2014: 149-156.
Frenay, B., Hofmann, D., Schulz, A., Biehl, M., & Hammer, B. (2014). Valid interpretation of feature relevance for linear data mappings. 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM), 149-156. Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE). https://doi.org/10.1109/cidm.2014.7008661
Frenay, Benoit, Hofmann, Daniela, Schulz, Alexander, Biehl, Michael, and Hammer, Barbara. 2014. “Valid interpretation of feature relevance for linear data mappings”. In 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM), 149-156. Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE).
Frenay, B., Hofmann, D., Schulz, A., Biehl, M., and Hammer, B. (2014). “Valid interpretation of feature relevance for linear data mappings” in 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM) (Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE), 149-156.
Frenay, B., et al., 2014. Valid interpretation of feature relevance for linear data mappings. In 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE), pp. 149-156.
B. Frenay, et al., “Valid interpretation of feature relevance for linear data mappings”, 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM), Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE), 2014, pp.149-156.
Frenay, B., Hofmann, D., Schulz, A., Biehl, M., Hammer, B.: Valid interpretation of feature relevance for linear data mappings. 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). p. 149-156. Institute of Electrical & Electronics Engineers (IEEE), Piscataway, NJ (2014).
Frenay, Benoit, Hofmann, Daniela, Schulz, Alexander, Biehl, Michael, and Hammer, Barbara. “Valid interpretation of feature relevance for linear data mappings”. 2014 IEEE Symposium on Computational Intelligence and Data Mining (CIDM). Piscataway, NJ: Institute of Electrical & Electronics Engineers (IEEE), 2014. 149-156.
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