A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection
Narayan V, Tscherepanow M, Wrede B (2011)
In: IEEE Workshop on Applications of Computer Vision. IEEE Computer Society.
Konferenzbeitrag
| Veröffentlicht | Englisch
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Einrichtung
Abstract / Bemerkung
In this article, we propose a bottom-up saliency model which works on capturing the contrast between random pixels in an image. The model is explained on the basis of the stimulus bias between two given stimuli (pixel intensity values) in an image and has a minimal set of tunable parameters. The methodology does not require any training bases or priors. We followed an established experimental setting and obtained state-of-the-art-results for salient region detection on the MSR dataset. Further experiments demonstrate that our method is robust to noise and has, in comparison to six other state-of-the-art models, a consistent performance in terms of recall, precision and F-measure.
Stichworte
Bottom-up attention;
Saliency map;
Salient region detection;
Visual attention
Erscheinungsjahr
2011
Titel des Konferenzbandes
IEEE Workshop on Applications of Computer Vision
Konferenz
IEEE Workshop on Applications of Computer Vision
Konferenzort
Kona, HW, USA
Page URI
https://pub.uni-bielefeld.de/record/2034754
Zitieren
Narayan V, Tscherepanow M, Wrede B. A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection. In: IEEE Workshop on Applications of Computer Vision. IEEE Computer Society; 2011.
Narayan, V., Tscherepanow, M., & Wrede, B. (2011). A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection. IEEE Workshop on Applications of Computer Vision IEEE Computer Society. https://doi.org/10.1109/wacv.2011.5711499
Narayan, Vikram, Tscherepanow, Marko, and Wrede, Britta. 2011. “A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection”. In IEEE Workshop on Applications of Computer Vision. IEEE Computer Society.
Narayan, V., Tscherepanow, M., and Wrede, B. (2011). “A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection” in IEEE Workshop on Applications of Computer Vision (IEEE Computer Society).
Narayan, V., Tscherepanow, M., & Wrede, B., 2011. A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection. In IEEE Workshop on Applications of Computer Vision. IEEE Computer Society.
V. Narayan, M. Tscherepanow, and B. Wrede, “A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection”, IEEE Workshop on Applications of Computer Vision, IEEE Computer Society, 2011.
Narayan, V., Tscherepanow, M., Wrede, B.: A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection. IEEE Workshop on Applications of Computer Vision. IEEE Computer Society (2011).
Narayan, Vikram, Tscherepanow, Marko, and Wrede, Britta. “A Random Center Surround Bottom up Visual Attention Model useful for Salient Region Detection”. IEEE Workshop on Applications of Computer Vision. IEEE Computer Society, 2011.
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