Please note that PUB no longer supports Internet Explorer versions 8 or 9 (or earlier).

We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.

21 Publikationen

2017 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2916488
Induction of tin pest for cleaning tin-drop contaminated optics
Boewering N (2017)
MATERIALS CHEMISTRY AND PHYSICS 198: 236-242.
PUB | DOI | WoS
 
2013 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2622198
Advanced giant magnetoresistance technology for measurement applications
Weiss R, Mattheis R, Reiss G (2013)
Measurement Science And Technology 24(8): 082001.
PUB | DOI | WoS
 
2007 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1593045
Half-metallic {Co2MnSi/Co2FeSi} multilayered Heusler electrodes in magnetic tunnel junctions
Castrup A, Dasgupta S, Scherer T, Rosner H, Ellrich J, Kruk R, Ghafari M, Hahn H, Hütten A, Ebke D, Liu N-N, et al. (2007)
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 310(2): 2009-2011.
PUB | DOI | WoS
 
2007 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1593514
Actinic inspection of EUVL mask blank defects by photoemission electron microscopy: Effect of inspection wavelength variation
Lin J, Neuhaeusler U, Slieh J, Brechling A, Heinzmann U, Weber N, Escher M, Merkel M, Oelsner A, Valdaitsev D, Schoenhense G, et al. (2007)
MICROELECTRONIC ENGINEERING 84(5-8): 1011-1014.
PUB | DOI | WoS
 
2007 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1631440
Phase defect inspection of multilayer masks for 13.5 nm optical lithography using PEEM in a standing wave mode
Maul J, Lin J, Oelsner A, Valdaitsev D, Weber N, Escher M, Merkel M, Seitz H, Heinzmann U, Kleineberg U, Schoenhense G (2007)
SURFACE SCIENCE 601(20): 4758-4763.
PUB | DOI | WoS
 
2006 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1599271
A new approach for actinic defect inspection of EUVL multilayer mask blanks: Standing wave photoemission electron microscopy
Neuhäusler U, Lin J, Oelsner A, Schicketanz M, Valdaitsev D, Slieh J, Weber N, Brzeska M, Wonisch A, Westerwalbesloh T, Brechling A, et al. (2006)
MICROELECTRONIC ENGINEERING 83(4-9): 680-683.
PUB | DOI | WoS
 
2006 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1596697
Magnetizing angle dependence of planar Hall resistance in spin-valve structure
Thanh NT, Chun MG, Schmalhorst J-M, Reiss G, Kim KY, Kim CG (2006)
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 304(1): e84-e87.
PUB | DOI | WoS
 
2004 | Bielefelder E-Dissertation | PUB-ID: 2305966 PUB | PDF
 
2003 | Bielefelder E-Dissertation | PUB-ID: 2305500 PUB | PDF
 
2002 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1614682
High room temperature sensitivity of magnetoresistance in NiFe/CuAgAu/Co/CuAgAu multilayers
Urbaniak M, Lucinski T, Stobiecki F, Hütten A, Reiss G (2002)
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 239(1-3): 288-290.
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1616226
Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers - X-ray comparative study
Anopchenko A, Jergel M, Majkova E, Luby S, Holy V, Aschentrup A, Kolina I, Lim YC, Haindl G, Kleineberg U, Heinzmann U (2001)
PHYSICA B-CONDENSED MATTER 305(1): 14-20.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618235
Reactive ion etching with end point detection of microstructured Mo/Si multilayers by optical emission spectroscopy
Dreeskornfeld L, Segler R, Haindl G, Wehmeyer O, Rahn S, Majkova E, Kleineberg U, Heinzmann U, Hudek P, Kostic I (2000)
MICROELECTRONIC ENGINEERING 54(3-4): 303-314.
PUB | DOI | WoS
 
2000 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1619226
Characterization of Ni80Fe20/Cu multilayers by X-ray reflection using anomalous scattering
Meyer DC, Richter K, Wehner B, Reiss G, van Loyen L, Paufler P (2000)
In: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2., 321-3. TRANS TECH PUBLICATIONS LTD: 451-456.
PUB | DOI | WoS
 
1999 | Bielefelder E-Dissertation | PUB-ID: 2302202
Modularisierung von neuronalen Netzen
Wagner H (1999)
Bielefeld (Germany): Bielefeld University.
PUB | Datei
 
1999 | Bielefelder E-Dissertation | PUB-ID: 2302401
Multilayer neural networks : learnability, network generation, and network simplification
Ellerbrock TM (01T00:00:00Z.01.1970)
Bielefeld (Germany): Bielefeld University.
PUB | Dateien verfügbar
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1622647
Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY
Kleineberg U, Menke D, Hamelmann F, Heinzmann U, Schmidt O, Fecher GH, Schoenhense G (1999)
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 103: 931-936.
PUB | DOI | WoS
 
1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1625020
X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics
Jergel M, Holy V, Majkova E, Luby S, Senderak R, Stock HJ, Menke D, Kleineberg U, Heinzmann U (1998)
PHYSICA B-CONDENSED MATTER 253(1-2): 28-39.
PUB | DOI | WoS
 
1997 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1627294
Multilayer-coated laminar grating with 16% normal-incidence efficiency in the 150-angstrom wavelength region
Seely JF, Kowalski MP, Cruddace RG, Heidemann KF, Heinzmann U, Kleineberg U, Osterried K, Menke D, Rife JC, Hunter WR (1997)
APPLIED OPTICS 36(31): 8206-8213.
PUB | DOI | WoS | PubMed | Europe PMC
 
1997 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2285884
An analog-current mode local cluster neural net
Sitte J, Korner T, Rückert U (1997)
In: Emerging Technologies and Factory Automation Proceedings, 1997. ETFA '97., 1997 6th International Conference on. 237-242.
PUB | DOI
 
1995 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1640073
MO/SI MULTILAYER-COATED RULED BLAZED GRATINGS FOR THE SOFT-X-RAY REGION
KLEINEBERG U, OSTERRIED K, STOCK HJ, MENKE D, SCHMIEDESKAMP B, FUCH D, MULLER P, SCHOLZE F, HEIDEMANN KF, NELLES B, Heinzmann U (1995)
APPLIED OPTICS 34(28): 6506-6512.
PUB | DOI | WoS | PubMed | Europe PMC
 

Filter und Suchbegriffe

keyword="multilayer"

Suche

Publikationen filtern

Darstellung / Sortierung

Export / Einbettung