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1 Publikation

2000 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1619226
Characterization of Ni80Fe20/Cu multilayers by X-ray reflection using anomalous scattering
Meyer DC, Richter K, Wehner B, Reiss G, van Loyen L, Paufler P (2000)
In: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2., 321-3. TRANS TECH PUBLICATIONS LTD: 451-456.
PUB | DOI | WoS
 

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