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3 Publikationen

1995 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1641782
STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .1. (ROOT-3X-ROOT-3)R30-DEGREES-XE PT(111)
POTTHOFF M, HILGERS G, Müller N, Heinzmann U, HAUNERT L, BRAUN J, BORSTEL G (1995)
SURFACE SCIENCE 322(1-3): 193-206.
PUB | DOI | WoS
 
1995 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1641790 PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775386 OA
Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
Reiss G, Levine LE, Smith DA (1993)
Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures 11(1): 108-111.
PUB | PDF | DOI | WoS
 

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