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26 Publikationen
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1616226
Anopchenko, A., Jergel, M., Majkova, E., Luby, S., Holy, V., Aschentrup, A., Kolina, I., et al. (2001). Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers - X-ray comparative study. PHYSICA B-CONDENSED MATTER, 305(1), 14-20. doi:10.1016/S0921-4526(01)00589-0
PUB | DOI | WoS
1999 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2330830
Bouhelier, A., Huser, T., Freyland, J. M., Güntherodt, H. J., & Pohl, D. W. (1999). Plasmon transmissivity and reflectivity of narrow grooves in a silver film. Journal of Microscopy, 194, 571-573.
PUB | WoS | PubMed | Europe PMC
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1622647
Kleineberg, U., Menke, D., Hamelmann, F., Heinzmann, U., Schmidt, O., Fecher, G. H., & Schoenhense, G. (1999). Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 103, 931-936. doi:10.1016/S0368-2048(98)00374-0
PUB | DOI | WoS
1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1625020
Jergel, M., Holy, V., Majkova, E., Luby, S., Senderak, R., Stock, H. J., Menke, D., et al. (1998). X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. PHYSICA B-CONDENSED MATTER, 253(1-2), 28-39. doi:10.1016/S0921-4526(98)00385-8
PUB | DOI | WoS
1994 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1644091
SCHMIEDESKAMP, B., KLOIDT, A., STOCK, H. J., KLEINEBERG, U., DOHRING, T., PROPPER, M., RAHN, S., et al. (1994). ELECTRON-BEAM-DEPOSITED MO/SI AND MO(X)SI(Y)/SI MULTILAYER X-RAY MIRRORS AND GRATINGS. OPTICAL ENGINEERING, 33(4), 1314-1321. doi:10.1117/12.163207
PUB | DOI | WoS