Please note that PUB no longer supports Internet Explorer versions 8 or 9 (or earlier).
We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.
30 Publikationen
2006 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2286278
Jäger, B., Porrmann, M., & Rückert, U. (2006). Bio-inspired massively parallel architectures for nanotechnologies. In IEEE Circuits and Systems Society (Ed.), Proceeding of the IEEE International Symposium on Circuits and Systems (ISCAS 2006). (pp. 1961-1964). Piscataway, NJ: IEEE. doi:10.1109/ISCAS.2006.1692996
PUB | DOI
2005 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1605264
Wieland, M., Spielmann, C., Kleineberg, U., Westerwalbesloh, T., Heinzmann, U., & Wilhein, T. (2005). Toward time-resolved soft X-ray microscopy using pulsed fs-high-harmonic radiation. ULTRAMICROSCOPY, 102(2), 93-100. doi:10.1016/j.ultramic.2004.09-001
PUB | DOI | WoS | PubMed | Europe PMC
2002 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351827
Brammer, T., Reetz, W., Senoussaoui, N., Vetterl, O., Kluth, O., Rech, B., Stiebig, H., et al. (2002). Optical properties of silicon-based thin-film solar cells in substrate and superstrate configuration. Solar Energy Materials and Solar Cells, 74(1-4), 469-478. doi:10.1016/S0927-0248(02)00109-5
PUB | DOI | WoS
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1616226
Anopchenko, A., Jergel, M., Majkova, E., Luby, S., Holy, V., Aschentrup, A., Kolina, I., et al. (2001). Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers - X-ray comparative study. PHYSICA B-CONDENSED MATTER, 305(1), 14-20. doi:10.1016/S0921-4526(01)00589-0
PUB | DOI | WoS
1999 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2330830
Bouhelier, A., Huser, T., Freyland, J. M., Güntherodt, H. J., & Pohl, D. W. (1999). Plasmon transmissivity and reflectivity of narrow grooves in a silver film. Journal of Microscopy, 194, 571-573.
PUB | WoS | PubMed | Europe PMC
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1622647
Kleineberg, U., Menke, D., Hamelmann, F., Heinzmann, U., Schmidt, O., Fecher, G. H., & Schoenhense, G. (1999). Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY. Journal of Electron Spectroscopy and Related Phenomena, JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 103, 931-936. ELSEVIER SCIENCE BV. doi:10.1016/S0368-2048(98)00374-0
PUB | DOI | WoS
1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1625020
Jergel, M., Holy, V., Majkova, E., Luby, S., Senderak, R., Stock, H. J., Menke, D., et al. (1998). X-ray scattering study of interface roughness correlation in Mo/Si and Ti/C multilayers for X-UV optics. PHYSICA B-CONDENSED MATTER, 253(1-2), 28-39. doi:10.1016/S0921-4526(98)00385-8
PUB | DOI | WoS
1994 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1644091
SCHMIEDESKAMP, B., KLOIDT, A., STOCK, H. J., KLEINEBERG, U., DOHRING, T., PROPPER, M., RAHN, S., et al. (1994). ELECTRON-BEAM-DEPOSITED MO/SI AND MO(X)SI(Y)/SI MULTILAYER X-RAY MIRRORS AND GRATINGS. OPTICAL ENGINEERING, 33(4), 1314-1321. doi:10.1117/12.163207
PUB | DOI | WoS