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34 Publikationen

2005 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351765
Optimization of phase-sensitive transparent detector for length measurements
Jun, K. H., Optimization of phase-sensitive transparent detector for length measurements. IEEE Transactions on Electron Devices 52 (7). , 2005
PUB | DOI | WoS
 
2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604354
Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient: IR spectra analysis
Hamelmann, Frank, Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient: IR spectra analysis. 7 (1). , 2005
PUB | WoS
 
2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604360
Optical and electrochromic characterization of multilayered mixed metal oxide thin films
Hamelmann, Frank, Optical and electrochromic characterization of multilayered mixed metal oxide thin films. 7 (1). , 2005
PUB | WoS
 
2004 | Bielefelder E-Dissertation | PUB-ID: 2304912
The Heusler alloy Co2MnSi in thin films
Kämmerer, Sven, The Heusler alloy Co2MnSi in thin films. (). Bielefeld (Germany), 2004
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2004 | Bielefelder E-Dissertation | PUB-ID: 2304635
Untersuchungen von dünnen Aluminiumoxid-Schichten
Czerkas, Slawomir, Untersuchungen von dünnen Aluminiumoxid-Schichten. (). Bielefeld (Germany), 2004
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2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1606874
Plasma-assisted deposition of thin silicon oxide films in a remote PECVD reactor and characterization of films produced under different conditions
Hamelmann, Frank, Plasma-assisted deposition of thin silicon oxide films in a remote PECVD reactor and characterization of films produced under different conditions. Vacuum 75 (4). , 2004
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618191
Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process
Lucinski, T, Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 222 (3). , 2000
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1620783
Surfactant-encapsulated clusters (SECs): (DODA)(20)(NH4)[H3Mo57V6(NO)(6)O-183(H2O)(18)], a case study
Kurth, DG, Surfactant-encapsulated clusters (SECs): (DODA)(20)(NH4)[H3Mo57V6(NO)(6)O-183(H2O)(18)], a case study. CHEMISTRY-A EUROPEAN JOURNAL 6 (2). , 2000
PUB | DOI | WoS | PubMed | Europe PMC
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1621132
Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films
Hütten, Andreas, Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films. 47 (15-16). , 1999
PUB | DOI | WoS
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2000276
Forces in foam films containing polyelectrolyte and surfactant
Von Klitzing, R, Forces in foam films containing polyelectrolyte and surfactant. Colloids and Surfaces A Physicochemical and Engineering Aspects 149 (1-3). , 1999
PUB | WoS
 
1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2353057
Near-field magneto-optical microscopy in collection and illumination mode
Matthes, F, Near-field magneto-optical microscopy in collection and illumination mode. Ultramicroscopy 71 (1-4). , 1998
PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775386
Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
Reiss, Günter, Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films. Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures 11 (1). , 1993
PUB | PDF | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775421
In situ scanning-tunneling-microscopy studies of current driven mass transport in Ag
Levine, L. E., In situ scanning-tunneling-microscopy studies of current driven mass transport in Ag. Journal of applied physics 74 (9). , 1993
PUB | PDF | DOI | WoS
 
1991 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775271
Scanning tunneling microscopy on rough surfaces: quantitative image analysis
Reiss, Günter, Scanning tunneling microscopy on rough surfaces: quantitative image analysis. Journal of applied physics 70 (1). , 1991
PUB | PDF | DOI | WoS
 

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