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34 Publikationen

2005 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351765
Jun, K.H., Bunte, E. & Stiebig, H. (2005). Optimization of phase-sensitive transparent detector for length measurements. IEEE Transactions on Electron Devices, 52(7), 1656-1661. Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/TED.2005.850614.
PUB | DOI | WoS
 
2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604354
Hamelmann, F., Heinzmann, U., Szekeres, A., Kirov, N. & Nikolova, T. (2005). Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient: IR spectra analysis (JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS), 7(1), 389-392. NATL INST OPTOELECTRONICS.
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2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604360
Hamelmann, F., Gesheva, K., Ivanova, T., Szekeres, A., Abrashev, M. & Heinzmann, U. (2005). Optical and electrochromic characterization of multilayered mixed metal oxide thin films (JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS), 7(1), 393-396. NATL INST OPTOELECTRONICS.
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2004 | Bielefelder E-Dissertation | PUB-ID: 2304912
Kämmerer, S. (2004). The Heusler alloy Co2MnSi in thin films. Bielefeld (Germany): Bielefeld University.
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2004 | Bielefelder E-Dissertation | PUB-ID: 2304635
Czerkas, S. (2004). Untersuchungen von dünnen Aluminiumoxid-Schichten. Bielefeld (Germany): Bielefeld University.
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2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1606874
Hamelmann, F., Aschentrup, A., Brechling, A., Heinzmann, U., Gushterov, A., Szekeres, A. & Simeonov, S. (2004). Plasma-assisted deposition of thin silicon oxide films in a remote PECVD reactor and characterization of films produced under different conditions. Vacuum, 75(4), 307-312. PERGAMON-ELSEVIER SCIENCE LTD. doi:10.1016/j.vacuum.2004.03.012.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618191
Lucinski, T., Czerkas, S., Brückl, H. & Reiss, G. (2000). Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 222(3), 327-336. ELSEVIER SCIENCE BV. doi:10.1016/S0304-8853(00)00564-3.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1620783
Kurth, D.G., Lehmann, P., Volkmer, D., Colfen, H., Koop, M.J., Müller, A. & Du Chesne, A. (2000). Surfactant-encapsulated clusters (SECs): (DODA)(20)(NH4)[H3Mo57V6(NO)(6)O-183(H2O)(18)], a case study. CHEMISTRY-A EUROPEAN JOURNAL, 6(2), 385-393. WILEY-V C H VERLAG GMBH. doi:10.1002/(SICI)1521-3765(20000117)6:2<385::AID-CHEM385>3.0.CO;2-A.
PUB | DOI | WoS | PubMed | Europe PMC
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1621132
Hütten, A., Mrozek, S., Heitmann, S., Hempel, T., Brückl, H. & Reiss, G. (1999). Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films (ACTA MATERIALIA), 47(15-16), 4245-4252. PERGAMON-ELSEVIER SCIENCE LTD. doi:10.1016/S1359-6454(99)00283-9.
PUB | DOI | WoS
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2000276
Von Klitzing, R., Espert, A., Asnacios, A., Hellweg, T., Colin, A. & Langevin, D. (1999). Forces in foam films containing polyelectrolyte and surfactant. Colloids and Surfaces A Physicochemical and Engineering Aspects (S. 131-140). Elsevier.
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1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2353057
Matthes, F., Brückl, H. & Reiss, G. (1998). Near-field magneto-optical microscopy in collection and illumination mode. Ultramicroscopy, 71(1-4), 243-248. Elsevier. doi:10.1016/S0304-3991(97)00094-6.
PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775386
Reiss, G., Levine, L.E. & Smith, D.A. (1993). Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films. Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures, 11(1), 108-111. doi:10.1116/1.586709.
PUB | PDF | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775421
Levine, L.E., Reiss, G. & Smith, D.A. (1993). In situ scanning-tunneling-microscopy studies of current driven mass transport in Ag. Journal of applied physics, 74(9), 5476-5482. doi:10.1063/1.354228.
PUB | PDF | DOI | WoS
 
1991 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775271
Reiss, G., Brückl, H., Vancea, J., Lecheler, R. & Hastreiter, E. (1991). Scanning tunneling microscopy on rough surfaces: quantitative image analysis. Journal of applied physics, 70(1), 523-525. doi:10.1063/1.350267.
PUB | PDF | DOI | WoS
 

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