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34 Publikationen

2005 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351765
Optimization of phase-sensitive transparent detector for length measurements
Jun KH, Bunte E, Stiebig H (2005)
IEEE Transactions on Electron Devices 52(7): 1656-1661.
PUB | DOI | WoS
 
2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604354
Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient: IR spectra analysis
Hamelmann F, Heinzmann U, Szekeres A, Kirov N, Nikolova T (2005)
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS 7(1): 389-392.
PUB | WoS
 
2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604360
Optical and electrochromic characterization of multilayered mixed metal oxide thin films
Hamelmann F, Gesheva K, Ivanova T, Szekeres A, Abrashev M, Heinzmann U (2005)
JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS 7(1): 393-396.
PUB | WoS
 
2004 | Bielefelder E-Dissertation | PUB-ID: 2304912
The Heusler alloy Co2MnSi in thin films
Kämmerer S (01T00:00:00Z.01.1970)
Bielefeld (Germany): Bielefeld University.
PUB | PDF
 
2004 | Bielefelder E-Dissertation | PUB-ID: 2304635
Untersuchungen von dünnen Aluminiumoxid-Schichten
Czerkas S (01T00:00:00Z.01.1970)
Bielefeld (Germany): Bielefeld University.
PUB | PDF
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1606874
Plasma-assisted deposition of thin silicon oxide films in a remote PECVD reactor and characterization of films produced under different conditions
Hamelmann F, Aschentrup A, Brechling A, Heinzmann U, Gushterov A, Szekeres A, Simeonov S (2004)
Vacuum 75(4): 307-312.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618191
Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process
Lucinski T, Czerkas S, Brückl H, Reiss G (2000)
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 222(3): 327-336.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1620783
Surfactant-encapsulated clusters (SECs): (DODA)(20)(NH4)[H3Mo57V6(NO)(6)O-183(H2O)(18)], a case study
Kurth DG, Lehmann P, Volkmer D, Colfen H, Koop MJ, Müller A, Du Chesne A (2000)
CHEMISTRY-A EUROPEAN JOURNAL 6(2): 385-393.
PUB | DOI | WoS | PubMed | Europe PMC
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1621132
Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films
Hütten A, Mrozek S, Heitmann S, Hempel T, Brückl H, Reiss G (1999)
ACTA MATERIALIA 47(15-16): 4245-4252.
PUB | DOI | WoS
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2000276
Forces in foam films containing polyelectrolyte and surfactant
Von Klitzing R, Espert A, Asnacios A, Hellweg T, Colin A, Langevin D (1999)
In: Colloids and Surfaces A Physicochemical and Engineering Aspects., 149(1-3). Elsevier: 131-140.
PUB | WoS
 
1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2353057
Near-field magneto-optical microscopy in collection and illumination mode
Matthes F, Brückl H, Reiss G (1998)
Ultramicroscopy 71(1-4): 243-248.
PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775386
Ultrahigh vacuum scanning-tunneling microscope for in situ studies of annealing and electromigration behavior of thin films
Reiss G, Levine LE, Smith DA (1993)
Journal of Vacuum Science and Technology, B: Microelectronics and Nanometer Structures 11(1): 108-111.
PUB | PDF | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775421
In situ scanning-tunneling-microscopy studies of current driven mass transport in Ag
Levine LE, Reiss G, Smith DA (1993)
Journal of applied physics 74(9): 5476-5482.
PUB | PDF | DOI | WoS
 
1991 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1775271
Scanning tunneling microscopy on rough surfaces: quantitative image analysis
Reiss G, Brückl H, Vancea J, Lecheler R, Hastreiter E (1991)
Journal of applied physics 70(1): 523-525.
PUB | PDF | DOI | WoS
 

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