Please note that PUB no longer supports Internet Explorer versions 8 or 9 (or earlier).

We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.

34 Publikationen

2005 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351765
Jun, K. H., Bunte, E., & Stiebig, H. (2005). Optimization of phase-sensitive transparent detector for length measurements. IEEE Transactions on Electron Devices, 52(7), 1656-1661. doi:10.1109/TED.2005.850614
PUB | DOI | WoS
 
2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604354
Hamelmann, F., Heinzmann, U., Szekeres, A., Kirov, N., & Nikolova, T. (2005). Deposition of silicon oxide thin films in TEOS with addition of oxygen to the plasma ambient: IR spectra analysis. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 7(1), 389-392.
PUB | WoS
 
2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1604360
Hamelmann, F., Gesheva, K., Ivanova, T., Szekeres, A., Abrashev, M., & Heinzmann, U. (2005). Optical and electrochromic characterization of multilayered mixed metal oxide thin films. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 7(1), 393-396.
PUB | WoS
 
2004 | Bielefelder E-Dissertation | PUB-ID: 2304912
Kämmerer, S. (2004). The Heusler alloy Co2MnSi in thin films. Bielefeld (Germany): Bielefeld University.
PUB | PDF
 
2004 | Bielefelder E-Dissertation | PUB-ID: 2304635
Czerkas, S. (2004). Untersuchungen von dünnen Aluminiumoxid-Schichten. Bielefeld (Germany): Bielefeld University.
PUB | PDF
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1606874
Hamelmann, F., Aschentrup, A., Brechling, A., Heinzmann, U., Gushterov, A., Szekeres, A., & Simeonov, S. (2004). Plasma-assisted deposition of thin silicon oxide films in a remote PECVD reactor and characterization of films produced under different conditions. Vacuum, 75(4), 307-312. doi:10.1016/j.vacuum.2004.03.012
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618191
Lucinski, T., Czerkas, S., Brückl, H., & Reiss, G. (2000). Growth and properties of Co/Al-O-x/Ni(80)Fe(20) trilayers monitored in-situ during deposition process. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 222(3), 327-336. doi:10.1016/S0304-8853(00)00564-3
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1620783
Kurth, D. G., Lehmann, P., Volkmer, D., Colfen, H., Koop, M. J., Müller, A., & Du Chesne, A. (2000). Surfactant-encapsulated clusters (SECs): (DODA)(20)(NH4)[H3Mo57V6(NO)(6)O-183(H2O)(18)], a case study. CHEMISTRY-A EUROPEAN JOURNAL, 6(2), 385-393. doi:10.1002/(SICI)1521-3765(20000117)6:2<385::AID-CHEM385>3.0.CO;2-A
PUB | DOI | WoS | PubMed | Europe PMC
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1621132
Hütten, A., Mrozek, S., Heitmann, S., Hempel, T., Brückl, H., & Reiss, G. (1999). Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films. ACTA MATERIALIA, 47(15-16), 4245-4252. doi:10.1016/S1359-6454(99)00283-9
PUB | DOI | WoS
 
1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2000276
Von Klitzing, R., Espert, A., Asnacios, A., Hellweg, T., Colin, A., & Langevin, D. (1999). Forces in foam films containing polyelectrolyte and surfactant. Colloids and Surfaces A Physicochemical and Engineering Aspects, 149, 131-140. Elsevier.
PUB | WoS
 

Filter und Suchbegriffe

keyword="Thin films"

Suche

Publikationen filtern

Darstellung / Sortierung

Zitationsstil: apa_indent

Export / Einbettung