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13 Publikationen

2019 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2937335
Sticking behavior and transformation of tin droplets on silicon wafers and multilayer-coated mirrors
Böwering, Norbert, Sticking behavior and transformation of tin droplets on silicon wafers and multilayer-coated mirrors. Applied Physics A 125 (9). , 2019
PUB | DOI | WoS
 
2009 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351649
Modelling of contact effects in microcrystalline silicon thin-film transistors
Chan, Kah-Yoong, Modelling of contact effects in microcrystalline silicon thin-film transistors. Applied Physics A 96 (3). , 2009
PUB | DOI | WoS
 
2008 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351669
Analysis of the laser ablation processes for thin-film silicon solar cells
Haas, Stefan, Analysis of the laser ablation processes for thin-film silicon solar cells. Applied Physics A 92 (4). , 2008
PUB | DOI | WoS
 
2007 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1593647
Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100)
Schramm, S., Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 88 (3). , 2007
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2315863
Photon-assisted tunneling versus tunneling of excited electrons in metal-insulator-metal junctions
Thon, A., Photon-assisted tunneling versus tunneling of excited electrons in metal-insulator-metal junctions. Appl. Phys. A 78 (2). , 2004
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407651
Electron dynamics in supported metal nanoparticles: relaxation and charge transfer studied by time-resolved photoemission
Pfeiffer, Walter, Electron dynamics in supported metal nanoparticles: relaxation and charge transfer studied by time-resolved photoemission. Applied Physics A 78 (7). , 2004
PUB | DOI | WoS
 
2003 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1610694
Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction
Aschentrup, A, Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 77 (5). , 2003
PUB | DOI | WoS
 
2002 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1612342
Inelastic neutron scattering on a mixed-valence dodecanuclear polyoxovanadate cluster
Basler, R, Inelastic neutron scattering on a mixed-valence dodecanuclear polyoxovanadate cluster. 74 (). , 2002
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618213
Fabrication and characterization of EUV multilayer mirrors optimized for small spectral reflection bandwidth
Lim, YC, Fabrication and characterization of EUV multilayer mirrors optimized for small spectral reflection bandwidth. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 72 (1). , 2001
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1616180
Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy
Kleineberg, U, Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73 (4). , 2001
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407668
Photoemission from multiply excited surface plasmons in Ag nanoparticles
Merschdorf, M., Photoemission from multiply excited surface plasmons in Ag nanoparticles. Applied Physics A 71 (5). , 2000
PUB | DOI | WoS
 
1998 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1624512
STM writing of artificial nanostructures in ultrathin PMMA and SAM resists and subsequent pattern transfer in a Mo/Si multilayer by reactive ion etching
Hartwich, J, STM writing of artificial nanostructures in ultrathin PMMA and SAM resists and subsequent pattern transfer in a Mo/Si multilayer by reactive ion etching. 66 (). , 1998
PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2356988
DETERMINATION OF C-60/C-70 RATIOS IN FULLERENE MIXTURES AND FILM CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY
LANG, HP, DETERMINATION OF C-60/C-70 RATIOS IN FULLERENE MIXTURES AND FILM CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY. Applied Physics A 56 (3). , 1993
PUB | DOI | WoS
 

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