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13 Publikationen

2019 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2937335
N. Böwering and C. Meier, “Sticking behavior and transformation of tin droplets on silicon wafers and multilayer-coated mirrors”, Applied Physics A, vol. 125, 2019, : 633.
PUB | DOI | WoS
 
2009 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351649
K.-Y. Chan, et al., “Modelling of contact effects in microcrystalline silicon thin-film transistors”, Applied Physics A, vol. 96, 2009, pp. 751-758.
PUB | DOI | WoS
 
2008 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351669
S. Haas, et al., “Analysis of the laser ablation processes for thin-film silicon solar cells”, Applied Physics A, vol. 92, 2008, pp. 755-759.
PUB | DOI | WoS
 
2007 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1593647
S. Schramm, et al., “Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100)”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 88, 2007, pp. 459-464.
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2315863
A. Thon, et al., “Photon-assisted tunneling versus tunneling of excited electrons in metal-insulator-metal junctions”, Appl. Phys. A, vol. 78, 2004, pp. 189-199.
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407651
W. Pfeiffer, C. Kennerknecht, and M. Merschdorf, “Electron dynamics in supported metal nanoparticles: relaxation and charge transfer studied by time-resolved photoemission”, Applied Physics A, vol. 78, 2004, pp. 1011-1028.
PUB | DOI | WoS
 
2003 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1610694
A. Aschentrup, et al., “Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 77, 2003, pp. 607-611.
PUB | DOI | WoS
 
2002 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1612342
R. Basler, et al., “Inelastic neutron scattering on a mixed-valence dodecanuclear polyoxovanadate cluster”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 74, 2002, pp. S734-S736.
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618213
Y.C. Lim, et al., “Fabrication and characterization of EUV multilayer mirrors optimized for small spectral reflection bandwidth”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 72, 2001, pp. 121-124.
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1616180
U. Kleineberg, et al., “Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 73, 2001, pp. 515-519.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407668
M. Merschdorf, et al., “Photoemission from multiply excited surface plasmons in Ag nanoparticles”, Applied Physics A, vol. 71, 2000, pp. 547-552.
PUB | DOI | WoS
 
1998 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1624512
J. Hartwich, et al., “STM writing of artificial nanostructures in ultrathin PMMA and SAM resists and subsequent pattern transfer in a Mo/Si multilayer by reactive ion etching”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 66, 1998, pp. S685-S688.
PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2356988
H.P. LANG, et al., “DETERMINATION OF C-60/C-70 RATIOS IN FULLERENE MIXTURES AND FILM CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY”, Applied Physics A, vol. 56, 1993, pp. 197-205.
PUB | DOI | WoS
 

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