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13 Publikationen

2019 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2937335
Böwering, N., & Meier, C., 2019. Sticking behavior and transformation of tin droplets on silicon wafers and multilayer-coated mirrors. Applied Physics A, 125(9): 633.
PUB | DOI | WoS
 
2009 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351649
Chan, K.-Y., et al., 2009. Modelling of contact effects in microcrystalline silicon thin-film transistors. Applied Physics A, 96(3), p 751-758.
PUB | DOI | WoS
 
2008 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351669
Haas, S., et al., 2008. Analysis of the laser ablation processes for thin-film silicon solar cells. Applied Physics A, 92(4), p 755-759.
PUB | DOI | WoS
 
2007 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1593647
Schramm, S., et al., 2007. Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100). APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 88(3), p 459-464.
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2315863
Thon, A., et al., 2004. Photon-assisted tunneling versus tunneling of excited electrons in metal-insulator-metal junctions. Appl. Phys. A, 78(2), p 189-199.
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407651
Pfeiffer, W., Kennerknecht, C., & Merschdorf, M., 2004. Electron dynamics in supported metal nanoparticles: relaxation and charge transfer studied by time-resolved photoemission. Applied Physics A, 78(7), p 1011-1028.
PUB | DOI | WoS
 
2003 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1610694
Aschentrup, A., et al., 2003. Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 77(5), p 607-611.
PUB | DOI | WoS
 
2002 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1612342
Basler, R., et al., 2002. Inelastic neutron scattering on a mixed-valence dodecanuclear polyoxovanadate cluster. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 74, p S734-S736.
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618213
Lim, Y.C., et al., 2001. Fabrication and characterization of EUV multilayer mirrors optimized for small spectral reflection bandwidth. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 72(1), p 121-124.
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1616180
Kleineberg, U., et al., 2001. Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 73(4), p 515-519.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407668
Merschdorf, M., et al., 2000. Photoemission from multiply excited surface plasmons in Ag nanoparticles. Applied Physics A, 71(5), p 547-552.
PUB | DOI | WoS
 
1998 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1624512
Hartwich, J., et al., 1998. STM writing of artificial nanostructures in ultrathin PMMA and SAM resists and subsequent pattern transfer in a Mo/Si multilayer by reactive ion etching. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 66, p S685-S688.
PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2356988
LANG, H.P., et al., 1993. DETERMINATION OF C-60/C-70 RATIOS IN FULLERENE MIXTURES AND FILM CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY. Applied Physics A, 56(3), p 197-205.
PUB | DOI | WoS
 

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