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13 Publikationen

2019 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2937335
Böwering, Norbert, and Meier, Christian. 2019. “Sticking behavior and transformation of tin droplets on silicon wafers and multilayer-coated mirrors”. Applied Physics A 125 (9): 633.
PUB | DOI | WoS
 
2009 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351649
Chan, Kah-Yoong, Hashem, Elias, Gordijn, Aad, Stiebig, Helmut, and Knipp, Dietmar. 2009. “Modelling of contact effects in microcrystalline silicon thin-film transistors”. Applied Physics A 96 (3): 751-758.
PUB | DOI | WoS
 
2008 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2351669
Haas, Stefan, Schoepe, Gunnar, Zahren, Christoph, and Stiebig, Helmut. 2008. “Analysis of the laser ablation processes for thin-film silicon solar cells”. Applied Physics A 92 (4): 755-759.
PUB | DOI | WoS
 
2007 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1593647
Schramm, S., Dantscher, S., Schramm, C., Autzen, O., Wesenberg, C., Hasselbrink, E., and Pfeiffer, Walter. 2007. “Photoinduced interface charging in multiphoton photoemission from ultrathin Ag films on Si(100)”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 88 (3): 459-464.
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2315863
Thon, A., Klamroth, T., Saalfrank, P., Diesing, D., and Pfeiffer, Walter. 2004. “Photon-assisted tunneling versus tunneling of excited electrons in metal-insulator-metal junctions”. Appl. Phys. A 78 (2): 189-199.
PUB | DOI | WoS
 
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407651
Pfeiffer, Walter, Kennerknecht, C., and Merschdorf, M. 2004. “Electron dynamics in supported metal nanoparticles: relaxation and charge transfer studied by time-resolved photoemission”. Applied Physics A 78 (7): 1011-1028.
PUB | DOI | WoS
 
2003 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1610694
Aschentrup, A, Hachmann, Wiebke, Westerwalbesloh, T, Lim, YC, Kleineberg, U, and Heinzmann, Ulrich. 2003. “Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 77 (5): 607-611.
PUB | DOI | WoS
 
2002 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1612342
Basler, R, Chaboussant, G, Andres, H, Kögerler, Paul, Krickemeyer, Erich, Bögge, Hartmut, Mutka, H, Müller, Achim, and Gudel, HU. 2002. “Inelastic neutron scattering on a mixed-valence dodecanuclear polyoxovanadate cluster”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 74: S734-S736.
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1618213
Lim, YC, Westermalbesloh, T, Aschentrup, A, Wehmeyer, O, Haindl, G, Kleineberg, U, and Heinzmann, Ulrich. 2001. “Fabrication and characterization of EUV multilayer mirrors optimized for small spectral reflection bandwidth”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 72 (1): 121-124.
PUB | DOI | WoS
 
2001 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1616180
Kleineberg, U, Haindl, G, Hütten, Andreas, Reiss, Günter, Gullikson, EM, Jones, MS, Mrowka, S, Rekawa, SB, and Underwood, JH. 2001. “Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73 (4): 515-519.
PUB | DOI | WoS
 
2000 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2407668
Merschdorf, M., Pfeiffer, Walter, Thon, A., Voll, S., and Gerber, G. 2000. “Photoemission from multiply excited surface plasmons in Ag nanoparticles”. Applied Physics A 71 (5): 547-552.
PUB | DOI | WoS
 
1998 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1624512
Hartwich, J, Dreeskornfeld, L, Heisig, V, Rahn, S, Wehmeyer, O, Kleineberg, U, and Heinzmann, Ulrich. 1998. “STM writing of artificial nanostructures in ultrathin PMMA and SAM resists and subsequent pattern transfer in a Mo/Si multilayer by reactive ion etching”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 66: S685-S688.
PUB | DOI | WoS
 
1993 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2356988
LANG, HP, THOMMENGEISER, V, BOLM, C, FELDER, M, FROMMER, J, WIESENDANGER, R, WERNER, H, et al. 1993. “DETERMINATION OF C-60/C-70 RATIOS IN FULLERENE MIXTURES AND FILM CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY”. Applied Physics A 56 (3): 197-205.
PUB | DOI | WoS
 

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