Few-shot geometry-aware keypoint localization
He X, Bharaj G, Ferman D, Rhodin H, Garrido P (2023)
In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition. 21337-21348.
Konferenzbeitrag | Englisch
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Autor*in
He, Xingzhe;
Bharaj, Gaurav;
Ferman, David;
Rhodin, HelgeUniBi 
;
Garrido, Pablo
;
Garrido, PabloErscheinungsjahr
2023
Titel des Konferenzbandes
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition
Seite(n)
21337-21348
Page URI
https://pub.uni-bielefeld.de/record/2992690
Zitieren
He X, Bharaj G, Ferman D, Rhodin H, Garrido P. Few-shot geometry-aware keypoint localization. In: Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition. 2023: 21337-21348.
He, X., Bharaj, G., Ferman, D., Rhodin, H., & Garrido, P. (2023). Few-shot geometry-aware keypoint localization. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 21337-21348.
He, Xingzhe, Bharaj, Gaurav, Ferman, David, Rhodin, Helge, and Garrido, Pablo. 2023. “Few-shot geometry-aware keypoint localization”. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 21337-21348.
He, X., Bharaj, G., Ferman, D., Rhodin, H., and Garrido, P. (2023). “Few-shot geometry-aware keypoint localization” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition 21337-21348.
He, X., et al., 2023. Few-shot geometry-aware keypoint localization. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition. pp. 21337-21348.
X. He, et al., “Few-shot geometry-aware keypoint localization”, Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2023, pp.21337-21348.
He, X., Bharaj, G., Ferman, D., Rhodin, H., Garrido, P.: Few-shot geometry-aware keypoint localization. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition. p. 21337-21348. (2023).
He, Xingzhe, Bharaj, Gaurav, Ferman, David, Rhodin, Helge, and Garrido, Pablo. “Few-shot geometry-aware keypoint localization”. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition. 2023. 21337-21348.
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