FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation
Velioglu R, Chan RK-W, Hammer B (2024)
In: 2024 International Joint Conference on Neural Networks (IJCNN). IEEE International Joint Conference on Neural Networks (IJCNN). New York: Institute of Electrical and Electronics Engineers (IEEE).
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Einrichtung
Abstract / Bemerkung
In the realm of fashion object detection and segmentation for online shopping images, existing state-of-the-art fashion parsing models encounter limitations, particularly when exposed to non-model-worn apparel and close-up shots. To address these failures, we introduce FashionFail; a new fashion dataset with e-commerce images for object detection and segmentation. The dataset is efficiently curated using our novel annotation tool that leverages recent foundation models. The primary objective of FashionFail is to serve as a test bed for evaluating the robustness of models. Our analysis reveals the shortcomings of leading models, such as Attribute-Mask R-CNN and Fashionformer. Additionally, we propose a baseline approach using naive data augmentation to mitigate common failure cases and improve model robustness. Through this work, we aim to inspire and support further research in fashion item detection and segmentation for industrial applications. The dataset, annotation tool, code, and models are available at https://rizavelioglu.github.io/fashionfail/.
Stichworte
fashion parsing;
model robustness;
dataset creation;
annotation tool;
object detection;
instance segmentation
Erscheinungsjahr
2024
Titel des Konferenzbandes
2024 International Joint Conference on Neural Networks (IJCNN)
Serien- oder Zeitschriftentitel
IEEE International Joint Conference on Neural Networks (IJCNN)
Konferenz
2024 International Joint Conference on Neural Networks (IJCNN)
Konferenzort
Yokohama, Japan
Konferenzdatum
2024-06-30 – 2024-07-05
ISBN
979-8-3503-5932-9,
979-8-3503-5931-2
ISSN
2161-4393
Page URI
https://pub.uni-bielefeld.de/record/2989164
Zitieren
Velioglu R, Chan RK-W, Hammer B. FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation. In: 2024 International Joint Conference on Neural Networks (IJCNN). IEEE International Joint Conference on Neural Networks (IJCNN). New York: Institute of Electrical and Electronics Engineers (IEEE); 2024.
Velioglu, R., Chan, R. K. - W., & Hammer, B. (2024). FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation. 2024 International Joint Conference on Neural Networks (IJCNN), IEEE International Joint Conference on Neural Networks (IJCNN) New York: Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/IJCNN60899.2024.10651287
Velioglu, Riza, Chan, Robin Kien-Wei, and Hammer, Barbara. 2024. “FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation”. In 2024 International Joint Conference on Neural Networks (IJCNN). IEEE International Joint Conference on Neural Networks (IJCNN). New York: Institute of Electrical and Electronics Engineers (IEEE).
Velioglu, R., Chan, R. K. - W., and Hammer, B. (2024). “FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation” in 2024 International Joint Conference on Neural Networks (IJCNN) IEEE International Joint Conference on Neural Networks (IJCNN) (New York: Institute of Electrical and Electronics Engineers (IEEE).
Velioglu, R., Chan, R.K.-W., & Hammer, B., 2024. FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation. In 2024 International Joint Conference on Neural Networks (IJCNN). IEEE International Joint Conference on Neural Networks (IJCNN). New York: Institute of Electrical and Electronics Engineers (IEEE).
R. Velioglu, R.K.-W. Chan, and B. Hammer, “FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation”, 2024 International Joint Conference on Neural Networks (IJCNN), IEEE International Joint Conference on Neural Networks (IJCNN), New York: Institute of Electrical and Electronics Engineers (IEEE), 2024.
Velioglu, R., Chan, R.K.-W., Hammer, B.: FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation. 2024 International Joint Conference on Neural Networks (IJCNN). IEEE International Joint Conference on Neural Networks (IJCNN). Institute of Electrical and Electronics Engineers (IEEE), New York (2024).
Velioglu, Riza, Chan, Robin Kien-Wei, and Hammer, Barbara. “FashionFail: Addressing Failure Cases in Fashion Object Detection and Segmentation”. 2024 International Joint Conference on Neural Networks (IJCNN). New York: Institute of Electrical and Electronics Engineers (IEEE), 2024. IEEE International Joint Conference on Neural Networks (IJCNN).
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