Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001)

Rodewald J, Thien J, Ruwisch K, Pohlmann T, Hoppe M, Schmalhorst J-M, Kupper K, Wollschläger J (2024)
Nanomaterials 14(8): 694.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
Rodewald, Jari; Thien, Jannis; Ruwisch, Kevin; Pohlmann, Tobias; Hoppe, Martin; Schmalhorst, Jan-MichaelUniBi ; Kupper, Karsten; Wollschläger, Joachim
Abstract / Bemerkung
Off-stoichiometric NixFe3-xO4 ultrathin films (x < 2.1) with varying Ni content x and thickness 16 (±2) nm were grown on MgO(001) by reactive molecular beam epitaxy. Synchrotron-based high-resolution X-ray diffraction measurements reveal vertical compressive strain for all films, resulting from a lateral pseudomorphic adaption of the film to the substrate lattice without any strain relaxation. Complete crystallinity with smooth interfaces and surfaces is obtained independent of the Ni content x. For x < 1 an expected successive conversion from Fe3O4 to NiFe2O4 is observed, whereas local transformation into NiO structures is observed for films with Ni content x > 1. However, angle-resolved hard X-ray photoelectron spectroscopy measurements indicate homogeneous cationic distributions without strictly separated phases independent of the Ni content, while X-ray absorption spectroscopy shows that also for x > 1, not all Fe2+ cations are substituted by Ni2+ cations. The ferrimagnetic behavior, as observed by superconducting quantum interference device magnetometry, is characterized by decreasing saturation magnetization due to the formation of antiferromagnetic NiO parts.
Stichworte
nickel ferrite; ultrathin films; strain-property relation; disordererd phase; synchrotron radiation; X-ray diffraction; hard X-ray photoelectron spectroscopy; X-ray absorption spectroscopy; X-ray circular dichroism; SQUID
Erscheinungsjahr
2024
Zeitschriftentitel
Nanomaterials
Band
14
Ausgabe
8
Art.-Nr.
694
eISSN
2079-4991
Page URI
https://pub.uni-bielefeld.de/record/2989116

Zitieren

Rodewald J, Thien J, Ruwisch K, et al. Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001). Nanomaterials. 2024;14(8): 694.
Rodewald, J., Thien, J., Ruwisch, K., Pohlmann, T., Hoppe, M., Schmalhorst, J. - M., Kupper, K., et al. (2024). Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001). Nanomaterials, 14(8), 694. https://doi.org/10.3390/nano14080694
Rodewald, Jari, Thien, Jannis, Ruwisch, Kevin, Pohlmann, Tobias, Hoppe, Martin, Schmalhorst, Jan-Michael, Kupper, Karsten, and Wollschläger, Joachim. 2024. “Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001)”. Nanomaterials 14 (8): 694.
Rodewald, J., Thien, J., Ruwisch, K., Pohlmann, T., Hoppe, M., Schmalhorst, J. - M., Kupper, K., and Wollschläger, J. (2024). Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001). Nanomaterials 14:694.
Rodewald, J., et al., 2024. Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001). Nanomaterials, 14(8): 694.
J. Rodewald, et al., “Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001)”, Nanomaterials, vol. 14, 2024, : 694.
Rodewald, J., Thien, J., Ruwisch, K., Pohlmann, T., Hoppe, M., Schmalhorst, J.-M., Kupper, K., Wollschläger, J.: Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001). Nanomaterials. 14, : 694 (2024).
Rodewald, Jari, Thien, Jannis, Ruwisch, Kevin, Pohlmann, Tobias, Hoppe, Martin, Schmalhorst, Jan-Michael, Kupper, Karsten, and Wollschläger, Joachim. “Structure-Related Electronic and Magnetic Properties in Ultrathin Epitaxial NixFe3-xO4 Films on MgO(001)”. Nanomaterials 14.8 (2024): 694.
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2024-05-15T08:03:07Z
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