Effect of Copper on the Carrier Lifetime in Black Silicon
Porte HP, Turchinovich D, Persheyev S, Fan Y, Rose MJ, Jepsen PU (2011)
Journal of Infrared, Millimeter, and Terahertz Waves 32(7): 883-886.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Porte, Henrik P.;
Turchinovich, DmitryUniBi;
Persheyev, Saydulla;
Fan, Yongchang;
Rose, Mervyn J.;
Jepsen, Peter Uhd
Einrichtung
Erscheinungsjahr
2011
Zeitschriftentitel
Journal of Infrared, Millimeter, and Terahertz Waves
Band
32
Ausgabe
7
Seite(n)
883-886
ISSN
1866-6892
eISSN
1866-6906
Page URI
https://pub.uni-bielefeld.de/record/2983628
Zitieren
Porte HP, Turchinovich D, Persheyev S, Fan Y, Rose MJ, Jepsen PU. Effect of Copper on the Carrier Lifetime in Black Silicon. Journal of Infrared, Millimeter, and Terahertz Waves. 2011;32(7):883-886.
Porte, H. P., Turchinovich, D., Persheyev, S., Fan, Y., Rose, M. J., & Jepsen, P. U. (2011). Effect of Copper on the Carrier Lifetime in Black Silicon. Journal of Infrared, Millimeter, and Terahertz Waves, 32(7), 883-886. https://doi.org/10.1007/s10762-011-9801-x
Porte, Henrik P., Turchinovich, Dmitry, Persheyev, Saydulla, Fan, Yongchang, Rose, Mervyn J., and Jepsen, Peter Uhd. 2011. “Effect of Copper on the Carrier Lifetime in Black Silicon”. Journal of Infrared, Millimeter, and Terahertz Waves 32 (7): 883-886.
Porte, H. P., Turchinovich, D., Persheyev, S., Fan, Y., Rose, M. J., and Jepsen, P. U. (2011). Effect of Copper on the Carrier Lifetime in Black Silicon. Journal of Infrared, Millimeter, and Terahertz Waves 32, 883-886.
Porte, H.P., et al., 2011. Effect of Copper on the Carrier Lifetime in Black Silicon. Journal of Infrared, Millimeter, and Terahertz Waves, 32(7), p 883-886.
H.P. Porte, et al., “Effect of Copper on the Carrier Lifetime in Black Silicon”, Journal of Infrared, Millimeter, and Terahertz Waves, vol. 32, 2011, pp. 883-886.
Porte, H.P., Turchinovich, D., Persheyev, S., Fan, Y., Rose, M.J., Jepsen, P.U.: Effect of Copper on the Carrier Lifetime in Black Silicon. Journal of Infrared, Millimeter, and Terahertz Waves. 32, 883-886 (2011).
Porte, Henrik P., Turchinovich, Dmitry, Persheyev, Saydulla, Fan, Yongchang, Rose, Mervyn J., and Jepsen, Peter Uhd. “Effect of Copper on the Carrier Lifetime in Black Silicon”. Journal of Infrared, Millimeter, and Terahertz Waves 32.7 (2011): 883-886.
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