Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction
Krewer KL, Mics Z, Arabski J, Schmerber G, Beaurepaire E, Bonn M, Turchinovich D (2018)
Optics Letters 43(3): 447.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Krewer, Keno L.;
Mics, Zoltan;
Arabski, Jacek;
Schmerber, Guy;
Beaurepaire, Eric;
Bonn, Mischa;
Turchinovich, DmitryUniBi
Einrichtung
Erscheinungsjahr
2018
Zeitschriftentitel
Optics Letters
Band
43
Ausgabe
3
Art.-Nr.
447
ISSN
0146-9592
eISSN
1539-4794
Page URI
https://pub.uni-bielefeld.de/record/2983611
Zitieren
Krewer KL, Mics Z, Arabski J, et al. Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters. 2018;43(3): 447.
Krewer, K. L., Mics, Z., Arabski, J., Schmerber, G., Beaurepaire, E., Bonn, M., & Turchinovich, D. (2018). Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters, 43(3), 447. https://doi.org/10.1364/OL.43.000447
Krewer, Keno L., Mics, Zoltan, Arabski, Jacek, Schmerber, Guy, Beaurepaire, Eric, Bonn, Mischa, and Turchinovich, Dmitry. 2018. “Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction”. Optics Letters 43 (3): 447.
Krewer, K. L., Mics, Z., Arabski, J., Schmerber, G., Beaurepaire, E., Bonn, M., and Turchinovich, D. (2018). Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters 43:447.
Krewer, K.L., et al., 2018. Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters, 43(3): 447.
K.L. Krewer, et al., “Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction”, Optics Letters, vol. 43, 2018, : 447.
Krewer, K.L., Mics, Z., Arabski, J., Schmerber, G., Beaurepaire, E., Bonn, M., Turchinovich, D.: Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction. Optics Letters. 43, : 447 (2018).
Krewer, Keno L., Mics, Zoltan, Arabski, Jacek, Schmerber, Guy, Beaurepaire, Eric, Bonn, Mischa, and Turchinovich, Dmitry. “Accurate terahertz spectroscopy of supported thin films by precise substrate thickness correction”. Optics Letters 43.3 (2018): 447.
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