Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography

Kollmann H, Esmann M, Becker SF, Piao X, Huynh C, Kautschor L-O, Bösker G, Vieker H, Beyer A, Gölzhäuser A, Park N, et al. (2016)
In: PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX. von Freymann G, Schoenfeld WV, Rumpf RC (Eds); (9759). SPIE.

Konferenzbeitrag | Veröffentlicht | Englisch
 
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Autor*in
Kollmann, H.; Esmann, M.; Becker, S.F.; Piao, X.; Huynh, C.; Kautschor, L.-O.; Bösker, G.; Vieker, HenningUniBi; Beyer, AndréUniBi ; Gölzhäuser, ArminUniBi ; Park, N.; Silies, M.
Alle
Herausgeber*in
von Freymann, Georg; Schoenfeld, Winston V.; Rumpf, Raymond C.
Abstract / Bemerkung
Metallic nanoantennas are able to spatially localize far-field electromagnetic waves on a few nanometer length scale in the form of surface plasmon excitations 1-3. Standard tools for fabricating bowtie and rod antennas with sub-20 nm feature sizes are Electron Beam Lithography or Ga-based Focused Ion Beam (FIB) Milling. These structures, however, often suffer from surface roughness and hence show only a limited optical polarization contrast and therefore a limited electric field localization. Here, we combine Ga- and He-ion based milling (HIM) for the fabrication of gold bowtie and rod antennas with gap sizes of less than 6 nm combined with a high aspect ratio. Using polarization-sensitive Third-Harmonic (TH) spectroscopy, we compare the nonlinear optical properties of single HIM-antennas with sub-6-nm gaps with those produced by standard Ga-based FIB. We find a pronounced enhancement of the total TH intensity of more than three in comparison to Ga-FIB antennas and a highly improved polarization contrast of the TH intensity of 250:1 for Heion produced antennas 4. These findings combined with Finite-Element Method calculations demonstrate a field enhancement of up to one hundred in the few-nanometer gap of the antenna. This makes He-ion beam milling a highly attractive and promising new tool for the fabrication of plasmonic nanoantennas with few-nanometer feature sizes.
Erscheinungsjahr
2016
Titel des Konferenzbandes
PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX
Ausgabe
9759
Art.-Nr.
975908
Konferenz
SPIE OPTO
Konferenzort
San Francisco, California
Konferenzdatum
2018-02-13 – 2018-02-18
Page URI
https://pub.uni-bielefeld.de/record/2982733

Zitieren

Kollmann H, Esmann M, Becker SF, et al. Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography. In: von Freymann G, Schoenfeld WV, Rumpf RC, eds. PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX. SPIE.; 2016.
Kollmann, H., Esmann, M., Becker, S. F., Piao, X., Huynh, C., Kautschor, L. - O., Bösker, G., et al. (2016). Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography. In G. von Freymann, W. V. Schoenfeld, & R. C. Rumpf (Eds.), PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX SPIE. https://doi.org/10.1117/12.2212689
Kollmann, H., Esmann, M., Becker, S.F., Piao, X., Huynh, C., Kautschor, L.-O., Bösker, G., et al. 2016. “Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography”. In PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX, ed. Georg von Freymann, Winston V. Schoenfeld, and Raymond C. Rumpf. SPIE.: 975908.
Kollmann, H., Esmann, M., Becker, S. F., Piao, X., Huynh, C., Kautschor, L. - O., Bösker, G., Vieker, H., Beyer, A., Gölzhäuser, A., et al. (2016). “Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography” in PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX, von Freymann, G., Schoenfeld, W. V., and Rumpf, R. C. eds. (SPIE.).
Kollmann, H., et al., 2016. Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography. In G. von Freymann, W. V. Schoenfeld, & R. C. Rumpf, eds. PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX. SPIE.
H. Kollmann, et al., “Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography”, PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX, G. von Freymann, W.V. Schoenfeld, and R.C. Rumpf, eds., SPIE., 2016.
Kollmann, H., Esmann, M., Becker, S.F., Piao, X., Huynh, C., Kautschor, L.-O., Bösker, G., Vieker, H., Beyer, A., Gölzhäuser, A., Park, N., Silies, M., Lienau, C.: Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography. In: von Freymann, G., Schoenfeld, W.V., and Rumpf, R.C. (eds.) PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX. SPIE. (2016).
Kollmann, H., Esmann, M., Becker, S.F., Piao, X., Huynh, C., Kautschor, L.-O., Bösker, G., Vieker, Henning, Beyer, André, Gölzhäuser, Armin, Park, N., Silies, M., and Lienau, C. “Ultrafast third-harmonic spectroscopy of single nanoantennas fabricated using helium-ion beam lithography”. PROCEEDINGS OF SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics IX. Ed. Georg von Freymann, Winston V. Schoenfeld, and Raymond C. Rumpf. SPIE., 2016.
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