Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy

Stohmann P, Koch S, Yang Y, Kaiser CD, Ehrens J, Schnack J, Biere N, Anselmetti D, Gölzhäuser A, Zhang X (2022)
Beilstein Journal of Nanotechnology 13: 462-471.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
Ultrathin membranes with subnanometer pores enabling molecular size-selective separation were generated on surfaces via electron-induced cross-linking of self-assembled monolayers (SAMs). The evolution of p-terphenylthiol (TPT) SAMs on Au(111) surfaces into cross-linked monolayers was observed with a scanning tunneling microscope. As the irradiation dose was increased, the cross- linked regions continued to grow and a large number of subnanometer voids appeared. Their equivalent diameter is 0.5 +/- 0.2 nm and the areal density is approximate to 1.7 x 10(17) m(-2). Supported by classical molecular dynamics simulations, we propose that these voids may correspond to free volumes inside a cross-linked monolayer.
Stichworte
carbon nanomembranes; electron-induced cross-linking; scanning tunneling; microscopy; self-assembled monolayers; subnanometerpores
Erscheinungsjahr
2022
Zeitschriftentitel
Beilstein Journal of Nanotechnology
Band
13
Seite(n)
462-471
eISSN
2190-4286
Page URI
https://pub.uni-bielefeld.de/record/2963814

Zitieren

Stohmann P, Koch S, Yang Y, et al. Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy. Beilstein Journal of Nanotechnology . 2022;13:462-471.
Stohmann, P., Koch, S., Yang, Y., Kaiser, C. D., Ehrens, J., Schnack, J., Biere, N., et al. (2022). Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy. Beilstein Journal of Nanotechnology , 13, 462-471. https://doi.org/10.3762/bjnano.13.39
Stohmann, P., Koch, S., Yang, Y., Kaiser, C. D., Ehrens, J., Schnack, J., Biere, N., Anselmetti, D., Gölzhäuser, A., and Zhang, X. (2022). Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy. Beilstein Journal of Nanotechnology 13, 462-471.
Stohmann, P., et al., 2022. Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy. Beilstein Journal of Nanotechnology , 13, p 462-471.
P. Stohmann, et al., “Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy”, Beilstein Journal of Nanotechnology , vol. 13, 2022, pp. 462-471.
Stohmann, P., Koch, S., Yang, Y., Kaiser, C.D., Ehrens, J., Schnack, J., Biere, N., Anselmetti, D., Gölzhäuser, A., Zhang, X.: Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy. Beilstein Journal of Nanotechnology . 13, 462-471 (2022).
Stohmann, Patrick, Koch, Sascha, Yang, Yang, Kaiser, Christopher David, Ehrens, Julian, Schnack, Jürgen, Biere, Niklas, Anselmetti, Dario, Gölzhäuser, Armin, and Zhang, Xianghui. “Investigation of electron-induced cross-linking of self-assembled monolayers by scanning tunneling microscopy”. Beilstein Journal of Nanotechnology 13 (2022): 462-471.

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