Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy

Büker B (2021)
Bielefeld: Universität Bielefeld.

Bielefelder E-Dissertation | Englisch
 
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2021
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144
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https://pub.uni-bielefeld.de/record/2959447

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Büker B. Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy. Bielefeld: Universität Bielefeld; 2021.
Büker, B. (2021). Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy. Bielefeld: Universität Bielefeld. https://doi.org/10.4119/unibi/2959447
Büker, Björn. 2021. Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy. Bielefeld: Universität Bielefeld.
Büker, B. (2021). Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy. Bielefeld: Universität Bielefeld.
Büker, B., 2021. Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy, Bielefeld: Universität Bielefeld.
B. Büker, Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy, Bielefeld: Universität Bielefeld, 2021.
Büker, B.: Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy. Universität Bielefeld, Bielefeld (2021).
Büker, Björn. Dual beam FIB methods for nano-prototyping and their application in magnetic thin film sensor development and microscopy. Bielefeld: Universität Bielefeld, 2021.
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