Modulation-enhanced localization microscopy

Reymond L, Huser T, Ruprecht V, Wieser S (2020)
JOURNAL OF PHYSICS-PHOTONICS 2(4): 041001.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
Download
Es wurden keine Dateien hochgeladen. Nur Publikationsnachweis!
Autor*in
Reymond, Loiec; Huser, ThomasUniBi ; Ruprecht, Verena; Wieser, Stefan
Abstract / Bemerkung
Super-resolution fluorescence microscopy has become a powerful tool in cell biology to observe sub-cellular organization and molecular details below the diffraction limit of light. Super-resolution methods are generally classified into three main concepts: stimulated emission depletion (STED), single molecule localization microscopy (SMLM) and structured illumination microscopy (SIM). Here, we highlight the novel concept of modulation-enhanced localization microscopy (meLM) which we designate as the 4(th)super-resolution method. Recently, a series of modulation-enhanced localization microscopy methods have emerged, namely MINFLUX, SIMPLE, SIMFLUX, ModLoc and ROSE. Although meLM combines key ideas from STED, SIM and SMLM, the main concept of meLM relies on a different idea: isolated emitters are localized by measuring their modulated fluorescence intensities in a precisely shifted structured illumination pattern. To position meLM alongside state-of-the-art super-resolution methods we first highlight the basic principles of existing techniques and show which parts of these principles are utilized by the meLM method. We then present the overall novel super-resolution principle of meLM that can theoretically reach unlimited localization precision whenever illumination patterns are translated by an arbitrarily small distance.
Stichworte
super-resolution microscopy; modulation enhanced localization; microscopy; minimal photon flux; localization precision; structured; illumination localization microscopy
Erscheinungsjahr
2020
Zeitschriftentitel
JOURNAL OF PHYSICS-PHOTONICS
Band
2
Ausgabe
4
Art.-Nr.
041001
ISSN
2515-7647
Page URI
https://pub.uni-bielefeld.de/record/2946493

Zitieren

Reymond L, Huser T, Ruprecht V, Wieser S. Modulation-enhanced localization microscopy. JOURNAL OF PHYSICS-PHOTONICS. 2020;2(4): 041001.
Reymond, L., Huser, T., Ruprecht, V., & Wieser, S. (2020). Modulation-enhanced localization microscopy. JOURNAL OF PHYSICS-PHOTONICS, 2(4), 041001. doi:10.1088/2515-7647/ab9eac
Reymond, L., Huser, T., Ruprecht, V., and Wieser, S. (2020). Modulation-enhanced localization microscopy. JOURNAL OF PHYSICS-PHOTONICS 2:041001.
Reymond, L., et al., 2020. Modulation-enhanced localization microscopy. JOURNAL OF PHYSICS-PHOTONICS, 2(4): 041001.
L. Reymond, et al., “Modulation-enhanced localization microscopy”, JOURNAL OF PHYSICS-PHOTONICS, vol. 2, 2020, : 041001.
Reymond, L., Huser, T., Ruprecht, V., Wieser, S.: Modulation-enhanced localization microscopy. JOURNAL OF PHYSICS-PHOTONICS. 2, : 041001 (2020).
Reymond, Loiec, Huser, Thomas, Ruprecht, Verena, and Wieser, Stefan. “Modulation-enhanced localization microscopy”. JOURNAL OF PHYSICS-PHOTONICS 2.4 (2020): 041001.

Export

Markieren/ Markierung löschen
Markierte Publikationen

Open Data PUB

Web of Science

Dieser Datensatz im Web of Science®

Suchen in

Google Scholar