On the reliability of highly magnified micrographs for structural analysis in materials science.

Wortmann M, Layland AS, Frese N, Kahmann U, Grothe T, Storck JL, Blachowicz T, Grzybowski J, Husgen B, Ehrmann A (2020)
Scientific reports 10(1): 14708.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
Wortmann, Martin; Layland, Ashley Stephen; Frese, NatalieUniBi; Kahmann, Uwe; Grothe, Timo; Storck, Jan Lukas; Blachowicz, Tomasz; Grzybowski, Jacek; Husgen, Bruno; Ehrmann, Andrea
Abstract / Bemerkung
Highly magnified micrographs are part of the majority of publications in materials science and related fields. They are often the basis for discussions and far-reaching conclusions on the nature of the specimen. In many cases, reviewers demand and researchers deliver only the bare minimum of micrographs to substantiate the research hypothesis at hand. In this work, we use heterogeneous poly(acrylonitrile) nanofiber nonwovens with embedded nanoparticles to demonstrate how an insufficient or biased micrograph selection may lead to erroneous conclusions. Different micrographs taken by transmission electron microscopy and helium ion microscopy with sometimes contradictory implications were analyzed and used as a basis for micromagnetic simulations. With this, we try to raise awareness for the possible consequences of cherry-picking for the reliability of scientific literature.
Erscheinungsjahr
2020
Zeitschriftentitel
Scientific reports
Band
10
Ausgabe
1
Art.-Nr.
14708
eISSN
2045-2322
Page URI
https://pub.uni-bielefeld.de/record/2945961

Zitieren

Wortmann M, Layland AS, Frese N, et al. On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific reports. 2020;10(1): 14708.
Wortmann, M., Layland, A. S., Frese, N., Kahmann, U., Grothe, T., Storck, J. L., Blachowicz, T., et al. (2020). On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific reports, 10(1), 14708. doi:10.1038/s41598-020-71682-8
Wortmann, M., Layland, A. S., Frese, N., Kahmann, U., Grothe, T., Storck, J. L., Blachowicz, T., Grzybowski, J., Husgen, B., and Ehrmann, A. (2020). On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific reports 10:14708.
Wortmann, M., et al., 2020. On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific reports, 10(1): 14708.
M. Wortmann, et al., “On the reliability of highly magnified micrographs for structural analysis in materials science.”, Scientific reports, vol. 10, 2020, : 14708.
Wortmann, M., Layland, A.S., Frese, N., Kahmann, U., Grothe, T., Storck, J.L., Blachowicz, T., Grzybowski, J., Husgen, B., Ehrmann, A.: On the reliability of highly magnified micrographs for structural analysis in materials science. Scientific reports. 10, : 14708 (2020).
Wortmann, Martin, Layland, Ashley Stephen, Frese, Natalie, Kahmann, Uwe, Grothe, Timo, Storck, Jan Lukas, Blachowicz, Tomasz, Grzybowski, Jacek, Husgen, Bruno, and Ehrmann, Andrea. “On the reliability of highly magnified micrographs for structural analysis in materials science.”. Scientific reports 10.1 (2020): 14708.

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