Resolution enhancement in an extended depth of field for volumetric two-photon microscopy

He H, Kong C, Chan KY, So WL, Fok HK, Ren Y, Lai CSW, Tsia KK, Wong KKY (2020)
OPTICS LETTERS 45(11): 3054-3057.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
He, Hongsen; Kong, CihangUniBi; Chan, Ka Yan; So, W. L.; Fok, Hiu Ka; Ren, Yuxuan; Lai, Cora S. W.; Tsia, Kevin K.; Wong, Kenneth K. Y.
Abstract / Bemerkung
The resolution enhancement over the extended depth of field (DOF) in the volumetric two-photon microscopy (TPM) is demonstrated by utilizing multiple orders of Bessel beams. Here the conventional method of switching laser modes (SLAM) in 2D is introduced to 3D, denoted as the volumetric SLAM (V-SLAM). The equivalent scanning beam in the TPM is a thin needle-like beam, which is generated from the subtraction between the needle-like 0th-order and the straw-like 1st-order Bessel beams. Compared with the 0th-order Bessel beam, the lateral resolution of the V-SLAM is increased by 28.6% and maintains over the axial depth of 56 mu m. The V-SLAM performance is evaluated by employing fluorescent beads and a mouse brain slice. The V-SLAM approach provides a promising solution to improve the lateral resolutions for fast volumetric imaging on sparsely distributed samples. (C) 2020 Optical Society of America
Erscheinungsjahr
2020
Zeitschriftentitel
OPTICS LETTERS
Band
45
Ausgabe
11
Seite(n)
3054-3057
ISSN
0146-9592
eISSN
1539-4794
Page URI
https://pub.uni-bielefeld.de/record/2944192

Zitieren

He H, Kong C, Chan KY, et al. Resolution enhancement in an extended depth of field for volumetric two-photon microscopy. OPTICS LETTERS. 2020;45(11):3054-3057.
He, H., Kong, C., Chan, K. Y., So, W. L., Fok, H. K., Ren, Y., Lai, C. S. W., et al. (2020). Resolution enhancement in an extended depth of field for volumetric two-photon microscopy. OPTICS LETTERS, 45(11), 3054-3057. doi:10.1364/OL.394282
He, H., Kong, C., Chan, K. Y., So, W. L., Fok, H. K., Ren, Y., Lai, C. S. W., Tsia, K. K., and Wong, K. K. Y. (2020). Resolution enhancement in an extended depth of field for volumetric two-photon microscopy. OPTICS LETTERS 45, 3054-3057.
He, H., et al., 2020. Resolution enhancement in an extended depth of field for volumetric two-photon microscopy. OPTICS LETTERS, 45(11), p 3054-3057.
H. He, et al., “Resolution enhancement in an extended depth of field for volumetric two-photon microscopy”, OPTICS LETTERS, vol. 45, 2020, pp. 3054-3057.
He, H., Kong, C., Chan, K.Y., So, W.L., Fok, H.K., Ren, Y., Lai, C.S.W., Tsia, K.K., Wong, K.K.Y.: Resolution enhancement in an extended depth of field for volumetric two-photon microscopy. OPTICS LETTERS. 45, 3054-3057 (2020).
He, Hongsen, Kong, Cihang, Chan, Ka Yan, So, W. L., Fok, Hiu Ka, Ren, Yuxuan, Lai, Cora S. W., Tsia, Kevin K., and Wong, Kenneth K. Y. “Resolution enhancement in an extended depth of field for volumetric two-photon microscopy”. OPTICS LETTERS 45.11 (2020): 3054-3057.

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