SIMPLE: Structured illumination based point localization estimator with enhanced precision
Reymond L, Ziegler J, Knapp C, Wang F-C, Huser T, Ruprecht V, Wieser S (2019)
Optics Express 27(17): 24578-24590.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Reymond, Loic;
Ziegler, Johannes;
Knapp, Christian;
Wang, Fung-Chen;
Huser, ThomasUniBi 
;
Ruprecht, Verena;
Wieser, Stefan
;
Ruprecht, Verena;
Wieser, StefanEinrichtung
Abstract / Bemerkung
We present a structured illumination microscopy based point localization estimator (SIMPLE) that achieves a 2-fold increase in single molecule localization precision compared to conventional centroid estimation methods. SIMPLE advances the recently introduced MINFLUX concept by using precisely phase-shifted sinusoidal wave patterns as nanometric rulers for simultaneous particle localization based on photon count variation over a 20 mu m field of view. We validate SIMPLE in silico and experimentally on a TIRF-SIM setup using a digital micro-mirror device (DMD) as a spatial light modulator. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Erscheinungsjahr
2019
Zeitschriftentitel
Optics Express
Band
27
Ausgabe
17
Seite(n)
24578-24590
ISSN
1094-4087
Page URI
https://pub.uni-bielefeld.de/record/2937346
Zitieren
Reymond L, Ziegler J, Knapp C, et al. SIMPLE: Structured illumination based point localization estimator with enhanced precision. Optics Express. 2019;27(17):24578-24590.
Reymond, L., Ziegler, J., Knapp, C., Wang, F. - C., Huser, T., Ruprecht, V., & Wieser, S. (2019). SIMPLE: Structured illumination based point localization estimator with enhanced precision. Optics Express, 27(17), 24578-24590. doi:10.1364/OE.27.024578
Reymond, Loic, Ziegler, Johannes, Knapp, Christian, Wang, Fung-Chen, Huser, Thomas, Ruprecht, Verena, and Wieser, Stefan. 2019. “SIMPLE: Structured illumination based point localization estimator with enhanced precision”. Optics Express 27 (17): 24578-24590.
Reymond, L., Ziegler, J., Knapp, C., Wang, F. - C., Huser, T., Ruprecht, V., and Wieser, S. (2019). SIMPLE: Structured illumination based point localization estimator with enhanced precision. Optics Express 27, 24578-24590.
Reymond, L., et al., 2019. SIMPLE: Structured illumination based point localization estimator with enhanced precision. Optics Express, 27(17), p 24578-24590.
L. Reymond, et al., “SIMPLE: Structured illumination based point localization estimator with enhanced precision”, Optics Express, vol. 27, 2019, pp. 24578-24590.
Reymond, L., Ziegler, J., Knapp, C., Wang, F.-C., Huser, T., Ruprecht, V., Wieser, S.: SIMPLE: Structured illumination based point localization estimator with enhanced precision. Optics Express. 27, 24578-24590 (2019).
Reymond, Loic, Ziegler, Johannes, Knapp, Christian, Wang, Fung-Chen, Huser, Thomas, Ruprecht, Verena, and Wieser, Stefan. “SIMPLE: Structured illumination based point localization estimator with enhanced precision”. Optics Express 27.17 (2019): 24578-24590.
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