Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules

Loske F, Rahe P, Kühnle A (2009)
Nanotechnology 20(26): 264010.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Loske, Felix; Rahe, Philipp; Kühnle, AngelikaUniBi
Abstract / Bemerkung
Non-contact atomic force microscopy (NC-AFM) was applied to study C-60 molecules on rutile TiO2(110). Depending on the tip-sample distance, distinctly different molecular contrasts are observed. Systematically decreasing the tip-sample distance results in contrast inversion that is obtained reproducibly on the C-60 islands. This change in contrast can be related to frequency shift versus distance (d f (z)) curves at different sample sites, unraveling crossing points in the d f (z) curves in the attractive regime. We have performed simulations based on a simple Morse potential, which reproduce the experimental results. This combined experimental and simulation study provides insight into the mechanisms responsible for molecular contrast in NC-AFM imaging. Moreover, this work demonstrates the importance of distance-dependent measurements for unambiguously identifying molecular positions within a molecular island using NC-AFM.
Erscheinungsjahr
2009
Zeitschriftentitel
Nanotechnology
Band
20
Ausgabe
26
Seite(n)
264010
ISSN
0957-4484
Page URI
https://pub.uni-bielefeld.de/record/2913843

Zitieren

Loske F, Rahe P, Kühnle A. Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules. Nanotechnology. 2009;20(26):264010.
Loske, F., Rahe, P., & Kühnle, A. (2009). Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules. Nanotechnology, 20(26), 264010. doi:10.1088/0957-4484/20/26/264010
Loske, F., Rahe, P., and Kühnle, A. (2009). Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules. Nanotechnology 20, 264010.
Loske, F., Rahe, P., & Kühnle, A., 2009. Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules. Nanotechnology, 20(26), p 264010.
F. Loske, P. Rahe, and A. Kühnle, “Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules”, Nanotechnology, vol. 20, 2009, pp. 264010.
Loske, F., Rahe, P., Kühnle, A.: Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules. Nanotechnology. 20, 264010 (2009).
Loske, Felix, Rahe, Philipp, and Kühnle, Angelika. “Contrast inversion in non-contact atomic force microscopy imaging of C-60 molecules”. Nanotechnology 20.26 (2009): 264010.
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4 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

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Electronic structure and imaging contrast of graphene moiré on metals.
Voloshina EN, Fertitta E, Garhofer A, Mittendorfer F, Fonin M, Thissen A, Dedkov YS., Sci Rep 3(), 2013
PMID: 23330062

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