Quantitative atomic force microscopy

Söngen H, Bechstein R, Kühnle A (2017)
Journal of Physics: Condensed Matter 29(27): 274001.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
A variety of atomic force microscopy (AFM) modes is employed in the field of surface science. The most prominent AFM modes include the amplitude modulation (AM) and the frequency modulation (FM) mode. Over the years, different ways for analyzing data acquired with different AFM modes have been developed, where each analysis is usually based on mode-specific assumptions and approximations. Checking the validity of the seemingly different approximations employed in the various analysis methods can be a tedious task. Moreover, a straightforward comparison of data analyzed with different methods can, therefore, be challenging. Here, we combine the existing evaluation methods which have been separately developed for the different AFM modes and present a unifying set of three equations. These three AFM equations allow for a straightforward analysis of AFM data within the harmonic approximation, regardless of the AFM mode. The three AFM equations provide the three and only pieces of information about the tip-sample force available within the harmonic approximation. We demonstrate the generality of our approach by quantitatively analyzing three-dimensional AFM data obtained in both the AM and FM mode.
Stichworte
atomic force microscopy; quantitative analysis; operation mode
Erscheinungsjahr
2017
Zeitschriftentitel
Journal of Physics: Condensed Matter
Band
29
Ausgabe
27
Seite(n)
274001
ISSN
0953-8984
eISSN
1361-648X
Page URI
https://pub.uni-bielefeld.de/record/2913777

Zitieren

Söngen H, Bechstein R, Kühnle A. Quantitative atomic force microscopy. Journal of Physics: Condensed Matter. 2017;29(27):274001.
Söngen, H., Bechstein, R., & Kühnle, A. (2017). Quantitative atomic force microscopy. Journal of Physics: Condensed Matter, 29(27), 274001. doi:10.1088/1361-648X/aa6f8b
Söngen, H., Bechstein, R., and Kühnle, A. (2017). Quantitative atomic force microscopy. Journal of Physics: Condensed Matter 29, 274001.
Söngen, H., Bechstein, R., & Kühnle, A., 2017. Quantitative atomic force microscopy. Journal of Physics: Condensed Matter, 29(27), p 274001.
H. Söngen, R. Bechstein, and A. Kühnle, “Quantitative atomic force microscopy”, Journal of Physics: Condensed Matter, vol. 29, 2017, pp. 274001.
Söngen, H., Bechstein, R., Kühnle, A.: Quantitative atomic force microscopy. Journal of Physics: Condensed Matter. 29, 274001 (2017).
Söngen, Hagen, Bechstein, Ralf, and Kühnle, Angelika. “Quantitative atomic force microscopy”. Journal of Physics: Condensed Matter 29.27 (2017): 274001.
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2019-09-06T09:18:51Z
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