Ambipolar characteristics of microcrystalline silicon thin-film transistors
Chan K-Y, Gordijn A, Stiebig H, Knipp D (2010)
physica status solidi (c) 7(3-4): 1144-1147.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Chan, Kah-Yoong;
Gordijn, Aad;
Stiebig, Helmut;
Knipp, Dietmar
Einrichtung
Erscheinungsjahr
2010
Zeitschriftentitel
physica status solidi (c)
Band
7
Ausgabe
3-4
Seite(n)
1144-1147
ISSN
1862-6351, 1610-1642
Page URI
https://pub.uni-bielefeld.de/record/2908235
Zitieren
Chan K-Y, Gordijn A, Stiebig H, Knipp D. Ambipolar characteristics of microcrystalline silicon thin-film transistors. physica status solidi (c). 2010;7(3-4):1144-1147.
Chan, K. - Y., Gordijn, A., Stiebig, H., & Knipp, D. (2010). Ambipolar characteristics of microcrystalline silicon thin-film transistors. physica status solidi (c), 7(3-4), 1144-1147. doi:10.1002/pssc.200982816
Chan, Kah-Yoong, Gordijn, Aad, Stiebig, Helmut, and Knipp, Dietmar. 2010. “Ambipolar characteristics of microcrystalline silicon thin-film transistors”. physica status solidi (c) 7 (3-4): 1144-1147.
Chan, K. - Y., Gordijn, A., Stiebig, H., and Knipp, D. (2010). Ambipolar characteristics of microcrystalline silicon thin-film transistors. physica status solidi (c) 7, 1144-1147.
Chan, K.-Y., et al., 2010. Ambipolar characteristics of microcrystalline silicon thin-film transistors. physica status solidi (c), 7(3-4), p 1144-1147.
K.-Y. Chan, et al., “Ambipolar characteristics of microcrystalline silicon thin-film transistors”, physica status solidi (c), vol. 7, 2010, pp. 1144-1147.
Chan, K.-Y., Gordijn, A., Stiebig, H., Knipp, D.: Ambipolar characteristics of microcrystalline silicon thin-film transistors. physica status solidi (c). 7, 1144-1147 (2010).
Chan, Kah-Yoong, Gordijn, Aad, Stiebig, Helmut, and Knipp, Dietmar. “Ambipolar characteristics of microcrystalline silicon thin-film transistors”. physica status solidi (c) 7.3-4 (2010): 1144-1147.
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