Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films
Auge A, Teichert N, Meinert M, Reiss G, Hütten A, Yüzüak E, Dincer I, Elerman Y, Ennen I, Schattschneider P (2012)
Phys. Rev. B 85(21).
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Zeitschriftenaufsatz
| Veröffentlicht
| Englisch
Autor
Auge, A.;
Teichert, NiklasUniBi;
Meinert, MarkusUniBi 
;
Reiss, GünterUniBi ;
Hütten, AndreasUniBi;
Yüzüak, E.;
Dincer, I.;
Elerman, Y.;
Ennen, IngaUniBi;
Schattschneider, P.
;
Reiss, GünterUniBi ;
Hütten, AndreasUniBi;
Yüzüak, E.;
Dincer, I.;
Elerman, Y.;
Ennen, IngaUniBi;
Schattschneider, P.Erscheinungsjahr
Zeitschriftentitel
Phys. Rev. B
Band
85
Ausgabe
21
PUB-ID
Zitieren
Auge A, Teichert N, Meinert M, et al. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B. 2012;85(21).
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., et al. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B, 85(21). doi:10.1103/physrevb.85.214118
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., Elerman, Y., Ennen, I., and Schattschneider, P. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B 85.
Auge, A., et al., 2012. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B, 85(21).
A. Auge, et al., “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”, Phys. Rev. B, vol. 85, 2012.
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., Elerman, Y., Ennen, I., Schattschneider, P.: Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B. 85, (2012).
Auge, A., Teichert, Niklas, Meinert, Markus, Reiss, Günter, Hütten, Andreas, Yüzüak, E., Dincer, I., Elerman, Y., Ennen, Inga, and Schattschneider, P. “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”. Phys. Rev. B 85.21 (2012).
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