Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films
Auge A, Teichert N, Meinert M, Reiss G, Hütten A, Yüzüak E, Dincer I, Elerman Y, Ennen I, Schattschneider P (2012)
Phys. Rev. B 85(21): 214118.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Auge, A.;
Teichert, NiklasUniBi;
Meinert, MarkusUniBi 
;
Reiss, GünterUniBi ;
Hütten, AndreasUniBi;
Yüzüak, E.;
Dincer, I.;
Elerman, Y.;
Ennen, IngaUniBi;
Schattschneider, P.
;
Reiss, GünterUniBi ;
Hütten, AndreasUniBi;
Yüzüak, E.;
Dincer, I.;
Elerman, Y.;
Ennen, IngaUniBi;
Schattschneider, P.Erscheinungsjahr
2012
Zeitschriftentitel
Phys. Rev. B
Band
85
Ausgabe
21
Art.-Nr.
214118
ISSN
1098-0121, 1550-235X
Page URI
https://pub.uni-bielefeld.de/record/2903424
Zitieren
Auge A, Teichert N, Meinert M, et al. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B. 2012;85(21): 214118.
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., et al. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B, 85(21), 214118. doi:10.1103/physrevb.85.214118
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., Elerman, Y., Ennen, I., and Schattschneider, P. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B 85:214118.
Auge, A., et al., 2012. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B, 85(21): 214118.
A. Auge, et al., “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”, Phys. Rev. B, vol. 85, 2012, : 214118.
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yüzüak, E., Dincer, I., Elerman, Y., Ennen, I., Schattschneider, P.: Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Phys. Rev. B. 85, : 214118 (2012).
Auge, A., Teichert, Niklas, Meinert, Markus, Reiss, Günter, Hütten, Andreas, Yüzüak, E., Dincer, I., Elerman, Y., Ennen, Inga, and Schattschneider, P. “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”. Phys. Rev. B 85.21 (2012): 214118.
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