Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions
Wilhelm RA, Gruber E, Ritter R, Heller R, Beyer A, Turchanin A, Klingner N, Huebner R, Stoeger-Pollach M, Vieker H, Hlawacek G, et al. (2015)
2D Materials 2(3): 035009.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Wilhelm, Richard A.;
Gruber, Elisabeth;
Ritter, Robert;
Heller, Rene;
Beyer, AndréUniBi 
;
Turchanin, Andrey;
Klingner, Nico;
Huebner, Rene;
Stoeger-Pollach, Michael;
Vieker, HenningUniBi;
Hlawacek, Gregor;
Gölzhäuser, ArminUniBi
Alle
;
Turchanin, Andrey;
Klingner, Nico;
Huebner, Rene;
Stoeger-Pollach, Michael;
Vieker, HenningUniBi;
Hlawacek, Gregor;
Gölzhäuser, ArminUniBi
Alle
Abstract / Bemerkung
Cross-linking of a self-assembled monolayer of 1,1'-biphenyl-4-thiol by low energy electron irradiation leads to the formation of a carbon nanomembrane, that is only 1 nm thick. Here we study the perforation of these freestanding membranes by slow highly charged ion irradiation with respect to the pore formation yield. It is found that a threshold in potential energy of the highly charged ions of about 10 keV must be exceeded in order to form round pores with tunable diameters in the range of 5-15 nm. Above this energy threshold, the efficiency for a single ion to form a pore increases from 70% to nearly 100% with increasing charge. These findings are verified by two independent methods, namely the analysis of individual membranes stacked together during irradiation and the detailed analysis of exit charge state spectra utilizing an electrostatic analyzer.
Stichworte
CNM;
SAM;
membrane;
slow highly charged ion
Erscheinungsjahr
2015
Zeitschriftentitel
2D Materials
Band
2
Ausgabe
3
Art.-Nr.
035009
ISSN
2053-1583
Page URI
https://pub.uni-bielefeld.de/record/2901301
Zitieren
Wilhelm RA, Gruber E, Ritter R, et al. Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions. 2D Materials. 2015;2(3): 035009.
Wilhelm, R. A., Gruber, E., Ritter, R., Heller, R., Beyer, A., Turchanin, A., Klingner, N., et al. (2015). Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions. 2D Materials, 2(3), 035009. doi:10.1088/2053-1583/2/3/035009
Wilhelm, Richard A., Gruber, Elisabeth, Ritter, Robert, Heller, Rene, Beyer, André, Turchanin, Andrey, Klingner, Nico, et al. 2015. “Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions”. 2D Materials 2 (3): 035009.
Wilhelm, R. A., Gruber, E., Ritter, R., Heller, R., Beyer, A., Turchanin, A., Klingner, N., Huebner, R., Stoeger-Pollach, M., Vieker, H., et al. (2015). Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions. 2D Materials 2:035009.
Wilhelm, R.A., et al., 2015. Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions. 2D Materials, 2(3): 035009.
R.A. Wilhelm, et al., “Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions”, 2D Materials, vol. 2, 2015, : 035009.
Wilhelm, R.A., Gruber, E., Ritter, R., Heller, R., Beyer, A., Turchanin, A., Klingner, N., Huebner, R., Stoeger-Pollach, M., Vieker, H., Hlawacek, G., Gölzhäuser, A., Facsko, S., Aumayr, F.: Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions. 2D Materials. 2, : 035009 (2015).
Wilhelm, Richard A., Gruber, Elisabeth, Ritter, Robert, Heller, Rene, Beyer, André, Turchanin, Andrey, Klingner, Nico, Huebner, Rene, Stoeger-Pollach, Michael, Vieker, Henning, Hlawacek, Gregor, Gölzhäuser, Armin, Facsko, Stefan, and Aumayr, Friedrich. “Threshold and efficiency for perforation of 1nm thick carbon nanomembranes with slow highly charged ions”. 2D Materials 2.3 (2015): 035009.
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