Focused particle beam-induced processing

Huth M, Gölzhäuser A (2015)
Beilstein Journal of Nanotechnology 6: 1883-1885.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
Huth, Michael; Gölzhäuser, ArminUniBi
Erscheinungsjahr
2015
Zeitschriftentitel
Beilstein Journal of Nanotechnology
Band
6
Seite(n)
1883-1885
ISSN
2190-4286
Page URI
https://pub.uni-bielefeld.de/record/2780392

Zitieren

Huth M, Gölzhäuser A. Focused particle beam-induced processing. Beilstein Journal of Nanotechnology. 2015;6:1883-1885.
Huth, M., & Gölzhäuser, A. (2015). Focused particle beam-induced processing. Beilstein Journal of Nanotechnology, 6, 1883-1885. doi:10.3762/bjnano.6.191
Huth, Michael, and Gölzhäuser, Armin. 2015. “Focused particle beam-induced processing”. Beilstein Journal of Nanotechnology 6: 1883-1885.
Huth, M., and Gölzhäuser, A. (2015). Focused particle beam-induced processing. Beilstein Journal of Nanotechnology 6, 1883-1885.
Huth, M., & Gölzhäuser, A., 2015. Focused particle beam-induced processing. Beilstein Journal of Nanotechnology, 6, p 1883-1885.
M. Huth and A. Gölzhäuser, “Focused particle beam-induced processing”, Beilstein Journal of Nanotechnology, vol. 6, 2015, pp. 1883-1885.
Huth, M., Gölzhäuser, A.: Focused particle beam-induced processing. Beilstein Journal of Nanotechnology. 6, 1883-1885 (2015).
Huth, Michael, and Gölzhäuser, Armin. “Focused particle beam-induced processing”. Beilstein Journal of Nanotechnology 6 (2015): 1883-1885.

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