Focused particle beam-induced processing

Huth M, Gölzhäuser A (2015)
Beilstein Journal of Nanotechnology 6: 1883-1885.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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DOI
Autor*in
Huth, Michael; Gölzhäuser, ArminUniBi
Einrichtung
Fakultät für Physik > AG Physik supramolekularer Systeme und Oberflächen
Erscheinungsjahr
2015
Zeitschriftentitel
Beilstein Journal of Nanotechnology
Band
6
Seite(n)
1883-1885
ISSN
2190-4286
Page URI
https://pub.uni-bielefeld.de/record/2780392

Zitieren

Huth M, Gölzhäuser A. Focused particle beam-induced processing. Beilstein Journal of Nanotechnology. 2015;6:1883-1885.
Huth, M., & Gölzhäuser, A. (2015). Focused particle beam-induced processing. Beilstein Journal of Nanotechnology, 6, 1883-1885. doi:10.3762/bjnano.6.191
Huth, Michael, and Gölzhäuser, Armin. 2015. “Focused particle beam-induced processing”. Beilstein Journal of Nanotechnology 6: 1883-1885.
Huth, M., and Gölzhäuser, A. (2015). Focused particle beam-induced processing. Beilstein Journal of Nanotechnology 6, 1883-1885.
Huth, M., & Gölzhäuser, A., 2015. Focused particle beam-induced processing. Beilstein Journal of Nanotechnology, 6, p 1883-1885.
M. Huth and A. Gölzhäuser, “Focused particle beam-induced processing”, Beilstein Journal of Nanotechnology, vol. 6, 2015, pp. 1883-1885.
Huth, M., Gölzhäuser, A.: Focused particle beam-induced processing. Beilstein Journal of Nanotechnology. 6, 1883-1885 (2015).
Huth, Michael, and Gölzhäuser, Armin. “Focused particle beam-induced processing”. Beilstein Journal of Nanotechnology 6 (2015): 1883-1885.

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17 References

Daten bereitgestellt von Europe PubMed Central.


Thorman R, Kumar T, Fairbrother D, Ingólfsson O., 2015
Continuum models of focused electron beam induced processing.
Toth M, Lobo C, Friedli V, Szkudlarek A, Utke I., Beilstein J Nanotechnol 6(), 2015
PMID: 26425405
Surface excitations in the modelling of electron transport for electron-beam-induced deposition experiments.
Salvat-Pujol F, Valenti R, Werner WS., Beilstein J Nanotechnol 6(), 2015
PMID: 26171301
Electron-stimulated purification of platinum nanostructures grown via focused electron beam induced deposition.
Lewis BB, Stanford MG, Fowlkes JD, Lester K, Plank H, Rack PD., Beilstein J Nanotechnol 6(), 2015
PMID: 25977862
Formation of pure Cu nanocrystals upon post-growth annealing of Cu-C material obtained from focused electron beam induced deposition: comparison of different methods.
Szkudlarek A, Rodrigues Vaz A, Zhang Y, Rudkowski A, Kapusta C, Erni R, Moshkalev S, Utke I., Beilstein J Nanotechnol 6(), 2015
PMID: 26425404
Structural transitions in electron beam deposited Co-carbonyl suspended nanowires at high electrical current densities.
Gazzadi GC, Frabboni S., Beilstein J Nanotechnol 6(), 2015
PMID: 26199833
Influence of the shape and surface oxidation in the magnetization reversal of thin iron nanowires grown by focused electron beam induced deposition.
Rodriguez LA, Deen L, Cordoba R, Magen C, Snoeck E, Koopmans B, De Teresa JM., Beilstein J Nanotechnol 6(), 2015
PMID: 26199835
Tunable magnetism on the lateral mesoscale by post-processing of Co/Pt heterostructures.
Dobrovolskiy OV, Kompaniiets M, Sachser R, Porrati F, Gspan C, Plank H, Huth M., Beilstein J Nanotechnol 6(), 2015
PMID: 26171284
Patterning technique for gold nanoparticles on substrates using a focused electron beam.
Noriki T, Abe S, Kajikawa K, Shimojo M., Beilstein J Nanotechnol 6(), 2015
PMID: 25977872
Fundamental edge broadening effects during focused electron beam induced nanosynthesis.
Schmied R, Fowlkes JD, Winkler R, Rack PD, Plank H., Beilstein J Nanotechnol 6(), 2015
PMID: 25821687
Scanning reflection ion microscopy in a helium ion microscope.
Petrov YV, Vyvenko OF., Beilstein J Nanotechnol 6(), 2015
PMID: 26171289
Nano-structuring, surface and bulk modification with a focused helium ion beam.
Fox D, Chen Y, Faulkner CC, Zhang H., Beilstein J Nanotechnol 3(), 2012
PMID: 23019554
Digging gold: keV He(+) ion interaction with Au.
Veligura V, Hlawacek G, Berkelaar RP, van Gastel R, Zandvliet HJ, Poelsema B., Beilstein J Nanotechnol 4(), 2013
PMID: 23946914
Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism.
Hlawacek G, Veligura V, Lorbek S, Mocking TF, George A, van Gastel R, Zandvliet HJ, Poelsema B., Beilstein J Nanotechnol 3(), 2012
PMID: 23019545
Channeling in helium ion microscopy: Mapping of crystal orientation.
Veligura V, Hlawacek G, van Gastel R, Zandvliet HJ, Poelsema B., Beilstein J Nanotechnol 3(), 2012
PMID: 23019544
Fabrication of carbon nanomembranes by helium ion beam lithography.
Zhang X, Vieker H, Beyer A, Golzhauser A., Beilstein J Nanotechnol 5(), 2014
PMID: 24605285
Imaging of carbon nanomembranes with helium ion microscopy.
Beyer A, Vieker H, Klett R, Meyer Zu Theenhausen H, Angelova P, Golzhauser A., Beilstein J Nanotechnol 6(), 2015
PMID: 26425423
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