Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions
Teichert N, Böhnke A, Behler A, Weise B, Waske A, Hütten A (2015)
Applied Physics Letters 106(19): 192401.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Teichert, NiklasUniBi;
Böhnke, AlexanderUniBi;
Behler, A.;
Weise, B.;
Waske, A.;
Hütten, AndreasUniBi
Abstract / Bemerkung
The exchange bias effect is commonly used to shift the coercive field of a ferromagnet. This technique is crucial for the use of magnetic tunnel junctions as logic or memory devices. Therefore, an independent switching of the two ferromagnetic electrodes is necessary to guarantee a reliable readout. Here, we demonstrate that the intrinsic exchange bias effect of Ni-Mn-Sn can be used to apply a unidirectional anisotropy to magnetic tunnel junctions. For this, we use epitaxial Ni-Mn-Sn films as pinning layers for microfabricated CoFeB/MgO/CoFeB magnetic tunnel junctions. We compare the exchange bias field (H-EB) measured after field cooling in -10 kOe external field by magnetization measurements with H-EB obtained from tunnel magnetoresistance measurements. Consistent for both methods, we find an exchange bias of about H-EB = 130 Oe at 10 K, which decreases with increasing temperature and vanishes above 70 K. (C) 2015 AIP Publishing LLC.
Erscheinungsjahr
2015
Zeitschriftentitel
Applied Physics Letters
Band
106
Ausgabe
19
Art.-Nr.
192401
ISSN
0003-6951
Page URI
https://pub.uni-bielefeld.de/record/2759872
Zitieren
Teichert N, Böhnke A, Behler A, Weise B, Waske A, Hütten A. Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions. Applied Physics Letters. 2015;106(19): 192401.
Teichert, N., Böhnke, A., Behler, A., Weise, B., Waske, A., & Hütten, A. (2015). Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions. Applied Physics Letters, 106(19), 192401. doi:10.1063/1.4921080
Teichert, Niklas, Böhnke, Alexander, Behler, A., Weise, B., Waske, A., and Hütten, Andreas. 2015. “Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions”. Applied Physics Letters 106 (19): 192401.
Teichert, N., Böhnke, A., Behler, A., Weise, B., Waske, A., and Hütten, A. (2015). Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions. Applied Physics Letters 106:192401.
Teichert, N., et al., 2015. Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions. Applied Physics Letters, 106(19): 192401.
N. Teichert, et al., “Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions”, Applied Physics Letters, vol. 106, 2015, : 192401.
Teichert, N., Böhnke, A., Behler, A., Weise, B., Waske, A., Hütten, A.: Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions. Applied Physics Letters. 106, : 192401 (2015).
Teichert, Niklas, Böhnke, Alexander, Behler, A., Weise, B., Waske, A., and Hütten, Andreas. “Exchange bias effect in martensitic epitaxial Ni-Mn-Sn thin films applied to pin CoFeB/MgO/CoFeB magnetic tunnel junctions”. Applied Physics Letters 106.19 (2015): 192401.
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