A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans
Meier T, Foerste A, Tavassolizadeh A, Rott K, Meyners D, Groeger R, Reiss G, Quandt E, Schimmel T, Hoelscher H (2015)
Beilstein Journal of Nanotechnology 6: 451-461.
Zeitschriftenaufsatz
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Autor*in
Meier, Tobias;
Foerste, Alexander;
Tavassolizadeh, Ali;
Rott, KarstenUniBi;
Meyners, Dirk;
Groeger, Roland;
Reiss, GünterUniBi
;
Quandt, Eckhard;
Schimmel, Thomas;
Hoelscher, Hendrik
![](https://pub.uni-bielefeld.de/images/icon_orcid.png)
Abstract / Bemerkung
We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 x 5 x 5 mu m(3) is mounted on a large-area scanner with a scan range of 800 x 800 x 35 mu m(3). In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers.
Stichworte
scanning probe microscopes and components;
magnetostriction;
atomic force microscopy (AFM);
magnetomechanical effects
Erscheinungsjahr
2015
Zeitschriftentitel
Beilstein Journal of Nanotechnology
Band
6
Seite(n)
451-461
ISSN
2190-4286
Page URI
https://pub.uni-bielefeld.de/record/2728374
Zitieren
Meier T, Foerste A, Tavassolizadeh A, et al. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans. Beilstein Journal of Nanotechnology. 2015;6:451-461.
Meier, T., Foerste, A., Tavassolizadeh, A., Rott, K., Meyners, D., Groeger, R., Reiss, G., et al. (2015). A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans. Beilstein Journal of Nanotechnology, 6, 451-461. doi:10.3762/bjnano.6.46
Meier, Tobias, Foerste, Alexander, Tavassolizadeh, Ali, Rott, Karsten, Meyners, Dirk, Groeger, Roland, Reiss, Günter, Quandt, Eckhard, Schimmel, Thomas, and Hoelscher, Hendrik. 2015. “A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans”. Beilstein Journal of Nanotechnology 6: 451-461.
Meier, T., Foerste, A., Tavassolizadeh, A., Rott, K., Meyners, D., Groeger, R., Reiss, G., Quandt, E., Schimmel, T., and Hoelscher, H. (2015). A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans. Beilstein Journal of Nanotechnology 6, 451-461.
Meier, T., et al., 2015. A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans. Beilstein Journal of Nanotechnology, 6, p 451-461.
T. Meier, et al., “A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans”, Beilstein Journal of Nanotechnology, vol. 6, 2015, pp. 451-461.
Meier, T., Foerste, A., Tavassolizadeh, A., Rott, K., Meyners, D., Groeger, R., Reiss, G., Quandt, E., Schimmel, T., Hoelscher, H.: A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans. Beilstein Journal of Nanotechnology. 6, 451-461 (2015).
Meier, Tobias, Foerste, Alexander, Tavassolizadeh, Ali, Rott, Karsten, Meyners, Dirk, Groeger, Roland, Reiss, Günter, Quandt, Eckhard, Schimmel, Thomas, and Hoelscher, Hendrik. “A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans”. Beilstein Journal of Nanotechnology 6 (2015): 451-461.
Daten bereitgestellt von European Bioinformatics Institute (EBI)
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Tavassolizadeh A, Rott K, Meier T, Quandt E, Hölscher H, Reiss G, Meyners D., Sensors (Basel) 16(11), 2016
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