Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks

Sievers S, Liebing N, Serrano-Guisan S, Ferreira R, Paz E, Caprile A, Manzin A, Pasquale M, Skowronski W, Stobiecki T, Rott K, et al. (2015)
IEEE Transactions on Magnetics 51(1): 1400804.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Abstract / Bemerkung
We explore the prospects of wafer-scale inductive probing of the critical current density j(c0) for spin-transfer torque (STT) switching of CoFeB/MgO/CoFeB magnetic tunnel junctions with varying MgO thickness. From inductive measurements, magnetostatic parameters and effective damping are derived and j(c0) is calculated based on STT equations. The inductive values compare well with the values derived from current-induced switching measurements on individual nanopillars. Using a wafer-scale inductive probe head could enable wafer probe station-based metrology of j(c0) in the future.
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Zeitschriftentitel
IEEE Transactions on Magnetics
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51
Ausgabe
1
Art.-Nr.
1400804
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Sievers S, Liebing N, Serrano-Guisan S, et al. Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks. IEEE Transactions on Magnetics. 2015;51(1): 1400804.
Sievers, S., Liebing, N., Serrano-Guisan, S., Ferreira, R., Paz, E., Caprile, A., Manzin, A., et al. (2015). Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks. IEEE Transactions on Magnetics, 51(1), 1400804. doi:10.1109/TMAG.2014.2357808
Sievers, S., Liebing, N., Serrano-Guisan, S., Ferreira, R., Paz, E., Caprile, A., Manzin, A., Pasquale, M., Skowronski, W., Stobiecki, T., et al. (2015). Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks. IEEE Transactions on Magnetics 51:1400804.
Sievers, S., et al., 2015. Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks. IEEE Transactions on Magnetics, 51(1): 1400804.
S. Sievers, et al., “Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks”, IEEE Transactions on Magnetics, vol. 51, 2015, : 1400804.
Sievers, S., Liebing, N., Serrano-Guisan, S., Ferreira, R., Paz, E., Caprile, A., Manzin, A., Pasquale, M., Skowronski, W., Stobiecki, T., Rott, K., Reiss, G., Langer, J., Ocker, B., Schumacher, H.W.: Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks. IEEE Transactions on Magnetics. 51, : 1400804 (2015).
Sievers, Sibylle, Liebing, Niklas, Serrano-Guisan, Santiago, Ferreira, Ricardo, Paz, Elvira, Caprile, Ambra, Manzin, Alessandra, Pasquale, Massimo, Skowronski, Witold, Stobiecki, Tomasz, Rott, Karsten, Reiss, Günter, Langer, Juergen, Ocker, Berthold, and Schumacher, Hans Werner. “Toward Wafer Scale Inductive Characterization of Spin-Transfer Torque Critical Current Density of Magnetic Tunnel Junction Stacks”. IEEE Transactions on Magnetics 51.1 (2015): 1400804.