Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms

Differt D, Pfeiffer W, Diesing D (2012)
Applied Physics Letters 101(11): 111608.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
Linear and nonlinear internal photoemission in a thin-film metal-insulator-metal heterosystem, i.e., a Ta-TaOx-Ag junction, together with surface reflectivity are mapped with a lateral resolution of better than 5 mu m. The spatial correlation of the different signals and time-resolved internal photoemission spectroscopy reveal excitation mechanisms and ballistic hot carrier injection. The internal photoemission yield variation with Ag layer thickness is quantitatively explained by above-barrier injection. The hot-spot-like behavior of the two-photon induced internal photoemission observed for short pulse excitation is attributed to local field enhancements because of Ag-film thickness reduction and plasmonic effects at structural defects. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4752734]
Erscheinungsjahr
2012
Zeitschriftentitel
Applied Physics Letters
Band
101
Ausgabe
11
Art.-Nr.
111608
ISSN
0003-6951
Page URI
https://pub.uni-bielefeld.de/record/2544253

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Differt D, Pfeiffer W, Diesing D. Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters. 2012;101(11): 111608.
Differt, D., Pfeiffer, W., & Diesing, D. (2012). Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters, 101(11), 111608. doi:10.1063/1.4752734
Differt, D., Pfeiffer, W., and Diesing, D. (2012). Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters 101:111608.
Differt, D., Pfeiffer, W., & Diesing, D., 2012. Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters, 101(11): 111608.
D. Differt, W. Pfeiffer, and D. Diesing, “Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms”, Applied Physics Letters, vol. 101, 2012, : 111608.
Differt, D., Pfeiffer, W., Diesing, D.: Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters. 101, : 111608 (2012).
Differt, Dominik, Pfeiffer, Walter, and Diesing, D. “Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms”. Applied Physics Letters 101.11 (2012): 111608.

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