Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms

Differt D, Pfeiffer W, Diesing D (2012)
Applied Physics Letters 101(11): 111608.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Abstract / Bemerkung
Linear and nonlinear internal photoemission in a thin-film metal-insulator-metal heterosystem, i.e., a Ta-TaOx-Ag junction, together with surface reflectivity are mapped with a lateral resolution of better than 5 mu m. The spatial correlation of the different signals and time-resolved internal photoemission spectroscopy reveal excitation mechanisms and ballistic hot carrier injection. The internal photoemission yield variation with Ag layer thickness is quantitatively explained by above-barrier injection. The hot-spot-like behavior of the two-photon induced internal photoemission observed for short pulse excitation is attributed to local field enhancements because of Ag-film thickness reduction and plasmonic effects at structural defects. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4752734]
Erscheinungsjahr
2012
Zeitschriftentitel
Applied Physics Letters
Band
101
Ausgabe
11
Seite(n)
111608
ISSN
0003-6951
Page URI
https://pub.uni-bielefeld.de/record/2544253

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Differt D, Pfeiffer W, Diesing D. Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters. 2012;101(11):111608.
Differt, D., Pfeiffer, W., & Diesing, D. (2012). Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters, 101(11), 111608. doi:10.1063/1.4752734
Differt, D., Pfeiffer, W., and Diesing, D. (2012). Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters 101, 111608.
Differt, D., Pfeiffer, W., & Diesing, D., 2012. Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters, 101(11), p 111608.
D. Differt, W. Pfeiffer, and D. Diesing, “Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms”, Applied Physics Letters, vol. 101, 2012, pp. 111608.
Differt, D., Pfeiffer, W., Diesing, D.: Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms. Applied Physics Letters. 101, 111608 (2012).
Differt, Dominik, Pfeiffer, Walter, and Diesing, D. “Scanning internal photoemission microscopy for the identification of hot carrier transport mechanisms”. Applied Physics Letters 101.11 (2012): 111608.