Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films
Auge A, Teichert N, Meinert M, Reiss G, Hütten A, Yuzuak E, Dincer I, Elerman Y, Ennen I, Schattschneider P (2012)
Physical Review B 85(21): 214118.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Auge, AlexanderUniBi;
Teichert, Niklas;
Meinert, MarkusUniBi 
;
Reiss, GünterUniBi ;
Hütten, AndreasUniBi;
Yuzuak, E.;
Dincer, I.;
Elerman, Y.;
Ennen, I.;
Schattschneider, P.
;
Reiss, GünterUniBi ;
Hütten, AndreasUniBi;
Yuzuak, E.;
Dincer, I.;
Elerman, Y.;
Ennen, I.;
Schattschneider, P.Einrichtung
Abstract / Bemerkung
We investigate the influence of the film thickness on the martensitic transformation for the example of Ni-Mn-Sn thin films. Epitaxial films with thicknesses ranging from 100 nm down to 10 nm were deposited on MgO by co-sputtering on heated substrates. The martensitic transformation is investigated using temperature dependent x-ray diffraction, magnetization and resistivity measurements. X-ray diffraction and transmission electron microscopy is used to study the growth and the martensitic structure of the films. We find that the martensitic transformation temperatures reduce and the transformation range increases with decreasing film thickness. We show that the transformation is still possible down to a film thickness of 10 nm. A systematic study on the resistance change caused by the martensitic transformation implies that the transformation is suppressed close to the interfaces to the MgO.
Erscheinungsjahr
2012
Zeitschriftentitel
Physical Review B
Band
85
Ausgabe
21
Art.-Nr.
214118
ISSN
1098-0121
eISSN
1550-235X
Page URI
https://pub.uni-bielefeld.de/record/2517949
Zitieren
Auge A, Teichert N, Meinert M, et al. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Physical Review B. 2012;85(21): 214118.
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yuzuak, E., Dincer, I., et al. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Physical Review B, 85(21), 214118. https://doi.org/10.1103/PhysRevB.85.214118
Auge, Alexander, Teichert, Niklas, Meinert, Markus, Reiss, Günter, Hütten, Andreas, Yuzuak, E., Dincer, I., Elerman, Y., Ennen, I., and Schattschneider, P. 2012. “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”. Physical Review B 85 (21): 214118.
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yuzuak, E., Dincer, I., Elerman, Y., Ennen, I., and Schattschneider, P. (2012). Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Physical Review B 85:214118.
Auge, A., et al., 2012. Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Physical Review B, 85(21): 214118.
A. Auge, et al., “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”, Physical Review B, vol. 85, 2012, : 214118.
Auge, A., Teichert, N., Meinert, M., Reiss, G., Hütten, A., Yuzuak, E., Dincer, I., Elerman, Y., Ennen, I., Schattschneider, P.: Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films. Physical Review B. 85, : 214118 (2012).
Auge, Alexander, Teichert, Niklas, Meinert, Markus, Reiss, Günter, Hütten, Andreas, Yuzuak, E., Dincer, I., Elerman, Y., Ennen, I., and Schattschneider, P. “Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films”. Physical Review B 85.21 (2012): 214118.
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