Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties

Raghavan R, Bechelany M, Parlinska M, Frey D, Mook WM, Beyer A, Michler J, Utke I (2012)
Applied Physics Letters 100(19): 191912.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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DOI
Autor*in
Raghavan, R.; Bechelany, M.; Parlinska, M.; Frey, D.; Mook, W. M.; Beyer, AndréUniBi ; Michler, J.; Utke, I.
Einrichtung
Fakultät für Physik > AG Physik supramolekularer Systeme und Oberflächen
Centrum für Biotechnologie
Abstract / Bemerkung
We report on a comprehensive structural and nanoindentation study of nanolaminates of Al2O3 and ZnO synthesized by atomic layer deposition (ALD). By reducing the bilayer thickness from 50 nm to below 1 nm, the nanocrystal size could be controlled in the nanolaminate structure. The softer and more compliant response of the multilayers as compared to the single layers of Al2O3 and ZnO is attributed to the structural change from nanocrystalline to amorphous at smaller bilayer thicknesses. It is also shown that ALD is a unique technique for studying the inverse Hall-Petch softening mechanism (E. Voce and D. Tabor, J. Inst. Metals 79(12), 465 (1951)) related to grain size effects in nanomaterials. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4711767]
Erscheinungsjahr
2012
Zeitschriftentitel
Applied Physics Letters
Band
100
Ausgabe
19
Art.-Nr.
191912
ISSN
0003-6951
Page URI
https://pub.uni-bielefeld.de/record/2509974

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Raghavan R, Bechelany M, Parlinska M, et al. Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties. Applied Physics Letters. 2012;100(19): 191912.
Raghavan, R., Bechelany, M., Parlinska, M., Frey, D., Mook, W. M., Beyer, A., Michler, J., et al. (2012). Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties. Applied Physics Letters, 100(19), 191912. doi:10.1063/1.4711767
Raghavan, R., Bechelany, M., Parlinska, M., Frey, D., Mook, W. M., Beyer, André, Michler, J., and Utke, I. 2012. “Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties”. Applied Physics Letters 100 (19): 191912.
Raghavan, R., Bechelany, M., Parlinska, M., Frey, D., Mook, W. M., Beyer, A., Michler, J., and Utke, I. (2012). Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties. Applied Physics Letters 100:191912.
Raghavan, R., et al., 2012. Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties. Applied Physics Letters, 100(19): 191912.
R. Raghavan, et al., “Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties”, Applied Physics Letters, vol. 100, 2012, : 191912.
Raghavan, R., Bechelany, M., Parlinska, M., Frey, D., Mook, W.M., Beyer, A., Michler, J., Utke, I.: Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties. Applied Physics Letters. 100, : 191912 (2012).
Raghavan, R., Bechelany, M., Parlinska, M., Frey, D., Mook, W. M., Beyer, André, Michler, J., and Utke, I. “Nanocrystalline-to-amorphous transition in nanolaminates grown by low temperature atomic layer deposition and related mechanical properties”. Applied Physics Letters 100.19 (2012): 191912.
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