DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES

MEYER E, WIESENDANGER R, Anselmetti D, HIDBER HR, GÜNTHERODT HJ, LEVY F, BERGER H (1990)
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 8(1): 495-499.

Zeitschriftenaufsatz | Veröffentlicht | Englisch
 
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Autor*in
MEYER, E; WIESENDANGER, R; Anselmetti, DarioUniBi ; HIDBER, HR; GÜNTHERODT, HJ; LEVY, F; BERGER, H
Erscheinungsjahr
1990
Zeitschriftentitel
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
Band
8
Ausgabe
1
Seite(n)
495-499
ISSN
0734-2101
Page URI
https://pub.uni-bielefeld.de/record/2357095

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MEYER E, WIESENDANGER R, Anselmetti D, et al. DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1990;8(1):495-499.
MEYER, E., WIESENDANGER, R., Anselmetti, D., HIDBER, H. R., GÜNTHERODT, H. J., LEVY, F., & BERGER, H. (1990). DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, 8(1), 495-499. https://doi.org/10.1116/1.576372
MEYER, E., WIESENDANGER, R., Anselmetti, D., HIDBER, H. R., GÜNTHERODT, H. J., LEVY, F., and BERGER, H. (1990). DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 8, 495-499.
MEYER, E., et al., 1990. DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, 8(1), p 495-499.
E. MEYER, et al., “DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES”, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, vol. 8, 1990, pp. 495-499.
MEYER, E., WIESENDANGER, R., Anselmetti, D., HIDBER, H.R., GÜNTHERODT, H.J., LEVY, F., BERGER, H.: DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8, 495-499 (1990).
MEYER, E, WIESENDANGER, R, Anselmetti, Dario, HIDBER, HR, GÜNTHERODT, HJ, LEVY, F, and BERGER, H. “DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES”. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 8.1 (1990): 495-499.

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