DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES
MEYER E, WIESENDANGER R, Anselmetti D, HIDBER HR, GÜNTHERODT HJ, LEVY F, BERGER H (1990)
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 8(1): 495-499.
Zeitschriftenaufsatz
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Autor*in
MEYER, E;
WIESENDANGER, R;
Anselmetti, DarioUniBi 
;
HIDBER, HR;
GÜNTHERODT, HJ;
LEVY, F;
BERGER, H
;
HIDBER, HR;
GÜNTHERODT, HJ;
LEVY, F;
BERGER, HErscheinungsjahr
1990
Zeitschriftentitel
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
Band
8
Ausgabe
1
Seite(n)
495-499
ISSN
0734-2101
Page URI
https://pub.uni-bielefeld.de/record/2357095
Zitieren
MEYER E, WIESENDANGER R, Anselmetti D, et al. DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 1990;8(1):495-499.
MEYER, E., WIESENDANGER, R., Anselmetti, D., HIDBER, H. R., GÜNTHERODT, H. J., LEVY, F., & BERGER, H. (1990). DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, 8(1), 495-499. https://doi.org/10.1116/1.576372
MEYER, E, WIESENDANGER, R, Anselmetti, Dario, HIDBER, HR, GÜNTHERODT, HJ, LEVY, F, and BERGER, H. 1990. “DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES”. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 8 (1): 495-499.
MEYER, E., WIESENDANGER, R., Anselmetti, D., HIDBER, H. R., GÜNTHERODT, H. J., LEVY, F., and BERGER, H. (1990). DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 8, 495-499.
MEYER, E., et al., 1990. DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, 8(1), p 495-499.
E. MEYER, et al., “DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES”, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, vol. 8, 1990, pp. 495-499.
MEYER, E., WIESENDANGER, R., Anselmetti, D., HIDBER, H.R., GÜNTHERODT, H.J., LEVY, F., BERGER, H.: DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8, 495-499 (1990).
MEYER, E, WIESENDANGER, R, Anselmetti, Dario, HIDBER, HR, GÜNTHERODT, HJ, LEVY, F, and BERGER, H. “DIFFERENT RESPONSE OF ATOMIC FORCE MICROSCOPY AND SCANNING TUNNELING MICROSCOPY TO CHARGE-DENSITY WAVES”. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 8.1 (1990): 495-499.
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