Self-diffusion in liquid interfaces
Herth S, Ye F, Eggersmann M, Gutfleisch O, Wurschum R (2004)
Physical Review Letters 92(9): 95901.
Zeitschriftenaufsatz
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Autor*in
Herth, SimoneUniBi;
Ye, F;
Eggersmann, M;
Gutfleisch, O;
Wurschum, R
Einrichtung
Abstract / Bemerkung
For studying self-diffusion in liquid interfaces, Fe-59 tracer diffusion was measured on ultrafine-grained Nd2Fe14B which undergoes an intergranular melting transition for low Nd excess. The diffusion coefficient in the intergranular liquid layers is found to be lower than in bulk melts indicating a hampered atomic mobility due to confinement. Well above the intergranular melting transition, the diffusivity in the liquid interfaces approaches a value characteristic for bulk melts.
Erscheinungsjahr
2004
Zeitschriftentitel
Physical Review Letters
Band
92
Ausgabe
9
Art.-Nr.
95901
ISSN
0031-9007
eISSN
1079-7114
Page URI
https://pub.uni-bielefeld.de/record/2355129
Zitieren
Herth S, Ye F, Eggersmann M, Gutfleisch O, Wurschum R. Self-diffusion in liquid interfaces. Physical Review Letters. 2004;92(9): 95901.
Herth, S., Ye, F., Eggersmann, M., Gutfleisch, O., & Wurschum, R. (2004). Self-diffusion in liquid interfaces. Physical Review Letters, 92(9), 95901. https://doi.org/10.1103/PhysRevLett.92.095901
Herth, Simone, Ye, F, Eggersmann, M, Gutfleisch, O, and Wurschum, R. 2004. “Self-diffusion in liquid interfaces”. Physical Review Letters 92 (9): 95901.
Herth, S., Ye, F., Eggersmann, M., Gutfleisch, O., and Wurschum, R. (2004). Self-diffusion in liquid interfaces. Physical Review Letters 92:95901.
Herth, S., et al., 2004. Self-diffusion in liquid interfaces. Physical Review Letters, 92(9): 95901.
S. Herth, et al., “Self-diffusion in liquid interfaces”, Physical Review Letters, vol. 92, 2004, : 95901.
Herth, S., Ye, F., Eggersmann, M., Gutfleisch, O., Wurschum, R.: Self-diffusion in liquid interfaces. Physical Review Letters. 92, : 95901 (2004).
Herth, Simone, Ye, F, Eggersmann, M, Gutfleisch, O, and Wurschum, R. “Self-diffusion in liquid interfaces”. Physical Review Letters 92.9 (2004): 95901.
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