Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications
Chan KY, Bunte E, Knipp D, Stiebig H (2008)
Semiconductor Science and Technology 22(11): 1213-1219.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Chan, K.Y.;
Bunte, E.;
Knipp, D.;
Stiebig, HelmutUniBi
Erscheinungsjahr
2008
Zeitschriftentitel
Semiconductor Science and Technology
Band
22
Ausgabe
11
Seite(n)
1213-1219
ISSN
0268-1242
eISSN
1361-6641
Page URI
https://pub.uni-bielefeld.de/record/2343760
Zitieren
Chan KY, Bunte E, Knipp D, Stiebig H. Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications. Semiconductor Science and Technology. 2008;22(11):1213-1219.
Chan, K. Y., Bunte, E., Knipp, D., & Stiebig, H. (2008). Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications. Semiconductor Science and Technology, 22(11), 1213-1219. https://doi.org/10.1088/0268-1242/22/11/006
Chan, K.Y., Bunte, E., Knipp, D., and Stiebig, Helmut. 2008. “Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications”. Semiconductor Science and Technology 22 (11): 1213-1219.
Chan, K. Y., Bunte, E., Knipp, D., and Stiebig, H. (2008). Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications. Semiconductor Science and Technology 22, 1213-1219.
Chan, K.Y., et al., 2008. Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications. Semiconductor Science and Technology, 22(11), p 1213-1219.
K.Y. Chan, et al., “Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications”, Semiconductor Science and Technology, vol. 22, 2008, pp. 1213-1219.
Chan, K.Y., Bunte, E., Knipp, D., Stiebig, H.: Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications. Semiconductor Science and Technology. 22, 1213-1219 (2008).
Chan, K.Y., Bunte, E., Knipp, D., and Stiebig, Helmut. “Microcrystalline Silicon Thin-Film Transistors for Large Area Electronic Applications”. Semiconductor Science and Technology 22.11 (2008): 1213-1219.
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