Thin phase selective transparent detector for length measurements

Bunte E, Jun KH, Stiebig H (2006)
J. Non-Cryst. Solids 352(9-20): 1783-1786.

Zeitschriftenaufsatz | Veröffentlicht| Englisch
 
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Autor/in
Bunte, E.; Jun, K.H.; Stiebig, HelmutUniBi
Erscheinungsjahr
2006
Zeitschriftentitel
J. Non-Cryst. Solids
Band
352
Ausgabe
9-20
Seite(n)
1783-1786
ISSN
0022-3093
Page URI
https://pub.uni-bielefeld.de/record/2342633

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Bunte E, Jun KH, Stiebig H. Thin phase selective transparent detector for length measurements. J. Non-Cryst. Solids. 2006;352(9-20):1783-1786.
Bunte, E., Jun, K. H., & Stiebig, H. (2006). Thin phase selective transparent detector for length measurements. J. Non-Cryst. Solids, 352(9-20), 1783-1786. doi:10.1016/j.jnoncrysol.2005.11.081
Bunte, E., Jun, K. H., and Stiebig, H. (2006). Thin phase selective transparent detector for length measurements. J. Non-Cryst. Solids 352, 1783-1786.
Bunte, E., Jun, K.H., & Stiebig, H., 2006. Thin phase selective transparent detector for length measurements. J. Non-Cryst. Solids, 352(9-20), p 1783-1786.
E. Bunte, K.H. Jun, and H. Stiebig, “Thin phase selective transparent detector for length measurements”, J. Non-Cryst. Solids, vol. 352, 2006, pp. 1783-1786.
Bunte, E., Jun, K.H., Stiebig, H.: Thin phase selective transparent detector for length measurements. J. Non-Cryst. Solids. 352, 1783-1786 (2006).
Bunte, E., Jun, K.H., and Stiebig, Helmut. “Thin phase selective transparent detector for length measurements”. J. Non-Cryst. Solids 352.9-20 (2006): 1783-1786.