Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich
Heinzelmann H, Huser T, Lacoste T, Güntherodt HJ, Pohl DW, Hecht B, Novotny L, Martin OJF, Hafner CV, Baggenstos H, Wild UP, et al. (1995)
Optical Engineering 34(8): 2441-2454.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
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Autor*in
Heinzelmann, H;
Huser, ThomasUniBi 
;
Lacoste, Th.;
Güntherodt, H. J.;
Pohl, D. W.;
Hecht, B.;
Novotny, L.;
Martin, O. J. F.;
Hafner, C. V.;
Baggenstos, H.;
Wild, U. P.;
Renn, A.
;
Lacoste, Th.;
Güntherodt, H. J.;
Pohl, D. W.;
Hecht, B.;
Novotny, L.;
Martin, O. J. F.;
Hafner, C. V.;
Baggenstos, H.;
Wild, U. P.;
Renn, A.Einrichtung
Abstract / Bemerkung
The concepts of near-field optical microscopy and experimental and theoretical work carried out in Switzerland over the last 10 years are reviewed. After a description of the pioneering experiments of the mid-1980s, we focus on the recent efforts of the three Swiss laboratories currently working in the field in close collaboration. This newly refreshed initiative in near-field optics is supported by the Swiss Priority Program Optique.
Stichworte
SINGLE-MOLECULE SPECTROSCOPY;
LIGHT CONFINEMENT;
FLUORESCENCE;
MULTIPLE MULTIPOLE METHOD;
SHEAR FORCE IMAGING;
EVANESCENCE;
MICROSCOPY;
SCANNING NEAR-FIELD OPTICAL MICROSCOPY;
PHOTON-SCANNING TUNNELING
Erscheinungsjahr
1995
Zeitschriftentitel
Optical Engineering
Band
34
Ausgabe
8
Seite(n)
2441-2454
ISSN
0091-3286
Page URI
https://pub.uni-bielefeld.de/record/2330919
Zitieren
Heinzelmann H, Huser T, Lacoste T, et al. Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich. Optical Engineering. 1995;34(8):2441-2454.
Heinzelmann, H., Huser, T., Lacoste, T., Güntherodt, H. J., Pohl, D. W., Hecht, B., Novotny, L., et al. (1995). Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich. Optical Engineering, 34(8), 2441-2454. https://doi.org/10.1117/12.205670
Heinzelmann, H, Huser, Thomas, Lacoste, Th., Güntherodt, H. J., Pohl, D. W., Hecht, B., Novotny, L., et al. 1995. “Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich”. Optical Engineering 34 (8): 2441-2454.
Heinzelmann, H., Huser, T., Lacoste, T., Güntherodt, H. J., Pohl, D. W., Hecht, B., Novotny, L., Martin, O. J. F., Hafner, C. V., Baggenstos, H., et al. (1995). Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich. Optical Engineering 34, 2441-2454.
Heinzelmann, H., et al., 1995. Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich. Optical Engineering, 34(8), p 2441-2454.
H. Heinzelmann, et al., “Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich”, Optical Engineering, vol. 34, 1995, pp. 2441-2454.
Heinzelmann, H., Huser, T., Lacoste, T., Güntherodt, H.J., Pohl, D.W., Hecht, B., Novotny, L., Martin, O.J.F., Hafner, C.V., Baggenstos, H., Wild, U.P., Renn, A.: Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich. Optical Engineering. 34, 2441-2454 (1995).
Heinzelmann, H, Huser, Thomas, Lacoste, Th., Güntherodt, H. J., Pohl, D. W., Hecht, B., Novotny, L., Martin, O. J. F., Hafner, C. V., Baggenstos, H., Wild, U. P., and Renn, A. “Scanning Near-Field Optical Microscopy in Basel, Ruschlikon, and Zurich”. Optical Engineering 34.8 (1995): 2441-2454.
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