Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy
Eng LM, Bammerlin M, Loppacher C, Guggisberg M, Bennewitz R, Luthi R, Meyer E, Huser T, Heinzelmann H, Güntherodt HJ (1999)
Ferroelectrics 222(1): 153-162.
Zeitschriftenaufsatz
| Veröffentlicht | Englisch
Download
Es wurden keine Dateien hochgeladen. Nur Publikationsnachweis!
Autor*in
Eng, L.M.;
Bammerlin, M.;
Loppacher, C.;
Guggisberg, M.;
Bennewitz, R.;
Luthi, R;
Meyer, E.;
Huser, ThomasUniBi ;
Heinzelmann, H.;
Güntherodt, H. J.
Einrichtung
Abstract / Bemerkung
Domain writing and reading on the nanometer scale is addressed with scanning force microscopy (SFM) Compared to other scanning probe methods, SFM provides broad possibilities for the on-line data controlling. i.e. three-dimensional mapping of polarisation distribution, differentiation between polarisation and topography, nanoscale domain switching of domains with a 60 nm diameter, recording of nanoscale hysteresis loops, phase transition mapping. domain wall imaging with 9 nm resolution, atomic resolution of ferroelectric surfaces, etc. All these issues are reported in this paper. The challenging result of such a concerted investigation is the possibility of using SFM for nanoscale domain writing and reading with nanometer resolution. Fig. 1 illustrates such an example where line shaped c - domains are purposely written into a ferroelectric Barium-Titanate single crystal with a 400 nm line-width. With this figure we highly appreciate and honour the work of Bob Newnham passing our best nano-wishes for his future.
Stichworte
nanoscale;
domain switching;
3-dimensional polarisation mapping;
scanning probe microscopy;
ferroelectric domains and domain walls;
hysteresis;
atomic resolution
Erscheinungsjahr
1999
Zeitschriftentitel
Ferroelectrics
Band
222
Ausgabe
1
Seite(n)
153-162
ISSN
0015-0193
eISSN
1563-5112
Page URI
https://pub.uni-bielefeld.de/record/2330836
Zitieren
Eng LM, Bammerlin M, Loppacher C, et al. Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics. 1999;222(1):153-162.
Eng, L. M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R., Meyer, E., et al. (1999). Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics, 222(1), 153-162. https://doi.org/10.1080/00150199908014811
Eng, L.M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R, Meyer, E., Huser, Thomas, Heinzelmann, H., and Güntherodt, H. J. 1999. “Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy”. Ferroelectrics 222 (1): 153-162.
Eng, L. M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R., Meyer, E., Huser, T., Heinzelmann, H., and Güntherodt, H. J. (1999). Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics 222, 153-162.
Eng, L.M., et al., 1999. Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics, 222(1), p 153-162.
L.M. Eng, et al., “Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy”, Ferroelectrics, vol. 222, 1999, pp. 153-162.
Eng, L.M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R., Meyer, E., Huser, T., Heinzelmann, H., Güntherodt, H.J.: Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics. 222, 153-162 (1999).
Eng, L.M., Bammerlin, M., Loppacher, C., Guggisberg, M., Bennewitz, R., Luthi, R, Meyer, E., Huser, Thomas, Heinzelmann, H., and Güntherodt, H. J. “Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy”. Ferroelectrics 222.1 (1999): 153-162.
Export
Markieren/ Markierung löschen
Markierte Publikationen
Web of Science
Dieser Datensatz im Web of Science®Suchen in